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About me

I am interested in advanced microscopy methods and synchrotron radiation techniques, including coherent diffraction techniques, x-ray imaging, tomography and deep learning in microscopy. I have experience in Ptychography, Fourier Ptychography, SAXS, XRD, Micro- and Nano-tomography, and I really like programming scientific tools that I can use to process my data. The type of systems I study is the scaled-up materials, in which information about their morphological structure at the nanometer scale needs to be extracted while keep a fairly big volume. I am constantly fighting to beat the depth-of-field limit in microscopy to obtain images with high Space-Bandwidth-Product (SBP).

Research interests

• Coherent X-ray imaging: holography, ptychography and coherent diffraction

• Optical microscopy : Fourier ptychography

• Correlative imaging: spectroscopy and phase contrast

• Numerical analysis and algorithm development

• Materials sciences

• Artificial intelligence: machine and deep learning

• Scaled-up materials

• X-rays and synchrotron instrumentation