Alf Larsson (Ericsson AB, Sweden)
Sigrid Eldh (Ericsson AB, Mälardalen University, Sweden; Carleton University, Canada)
Wahab Hamou-Lhadj (Concordia University, Canada)
Raphael Khoury (Université du Québec à Chicoutimi, Canada)
Oum-El-Kheir Aktouf (Grenoble INP, France)
oum-el-kheir.aktouf@lcis.grenoble-inp.fr
Emilia Cioroaica (Fraunhofer-IESE, Germany)
Emilia.Cioroaica@iese.fraunhofer.de
Alf Larsson (Ericsson AB, Sweden)
Mehdi Adda (University of Québec at Rimouski, Canada)
Amin Alipour (University of Houston, USA)
Sigrid Eldh (Ericsson AB, Sweden)
Naser Ezzati (Brock University, Canada)
Wahab Hamou-Lhadj (Concordia University, Canada)
Fehmi Jaafar (CRIM, Canada)
Raphael Khoury (Université du Québec à Chicoutimi, Canada)
Alf Larsson (Ericsson AB, Sweden)
Ingo Pill (Silicon Austria Labs (SAL), Austria)
Aymen Saied (Laval University, Canada)
Oum-El-Kheir Aktouf (Grenoble INP, France)
Barbora Buhnova (Masaryk University, Czechia)
Stanislav Chren (Aalto University, Finland)
Emilia Cioroaica (Fraunhofer-IESE, Germany)
Li Huang (Constructor Institute, Switzerland)
Matthias Jung (Fraunhofer-IESE, Germany)
Bruno Rossi (Masaryk University, Czechia)
Daniel Schneider (Fraunhofer-IESE, Germany)
Annabelle Mercier (University of Grenoble Alpes, France)
Stanislav Chren (Aalto University, Finland)