Personal Information

Hyungdong Lee (이형동)

2019.02 - , Postdoctoral Researcher, University of South Carolina, USA

2018.09 - 2019.01, Postdoctoral Researcher, Sungkyunkwan University (Advisor: Prof. Doyoung Byun)

2018.08, Ph.D. in Mechanical Engineering, Sungkyunkwan University (Advisor: Prof. Doyoung Byun)

2013.02, B.S. in Mechanical Engineering, Sungkyunkwan University


E-mail: hyngdng.lee@gmail.com

Mobile: +82-10-5224-8112 (Korea) / +1-803-306-4772 (USA)

[Awards and Honors]


  • Best Ph.D. Thesis Award in Fluid Division of Mechanical Engineering, The Korean Society of Mechanical Engineers (KSME), 2019
  • Global Ph.D. Fellowship, National Research Foundation (NRF), 2013 - 2018
  • Best Presentation Award, SKKU Research Conference, 2016
  • Graduate Student Scholarship, Sungkyunkwan University, 2013-2015
  • Undergraduate Student Scholarship, Sungkyunkwan University, 2010-2012

[Research Area]


  • Microfluidic system design and its application for printed electronics

- Direct patterning technology based on electrohydrodynamic jet (e-Jet) printing, electrospinning (near-field & far-field)

- Droplet generation system design (Ink-jet, Drop-on-demand method in electric field, Electrospraying)

- 3D printed electronic devices for electronic skin (e-skin) application

- Functional coating process on various substrates (hydrophobic/hydrophilic, super-hydrophobic)


  • Visualization technique to investigate fluid flow field

- Micro-scale particle image velocimetry (Pulsed laser / continuous laser, fluorescent particles, camera)

- Numerical analysis by Computational fluid dynamics (CFD) in micro-scale fluid flow


  • Solution processing functional ink formulation for bio-inspired micro/nanostructures

- Self-assembled two-dimensional materials at air/liquid interface (hydrogel, peptides)


  • Printed electronics

- Printed flexible and stretchable electronics for sensors (strain gauge)

- Printed flexible supercapacitors and organic thin-film transistors (OTFT)


  • Material characterization

- Surface morphology observation: SEM, TEM, AFM

- Crystal structure investigation: EDS, XRD

- Optical & Magnetic Property Measurement: UV-vis & IR, PL

- Electrical properties measurement : Probe-station, Potentiostat, Picoammeter, Function generator