Krafton / Team lead / User Modeling AI and AI Service Engineering team   07. 2025 ~

Krafton / Team lead / ML R&D team   04. 2025 ~ 07. 2025

Krafton / Deep learning engineer / ML R&D team   08. 2024 ~ 04. 2025

KAIST / Ph.D. in Department of Industrial and Systems Engineering   03. 2020 - 08.2024
Under the supervision of Prof. Heeyoung Kim

KAIST / M.S. in Department of Industrial and Systems Engineering   03. 2018 - 02. 2020

Under the supervision of Prof. Heeyoung Kim

KAIST  / B.S. in Department of Industrial and Systems Engineering   03. 2014 - 02. 2018

A Robust Data-centric Anti-Cheat Framework for Fair Competitive Gaming

M. Kim, J. Park, C. Lee, G. Seo, U. Hwang, H. Lee

International World Wide Web Conference (WWW) 2026.  [To be submitted]

Delving into Large Language Models for Effective Time-Series Anomaly Detection

J. Park, K. Jung, D. Lee, H. Lee, D. Gwak, C. Park, J. Choo, J. Cho

The 39th Annual Conference on Neural Information Processing Systems (NeurIPS) 2025.  [Under review]

Learnable Logit Adjustment for Imbalanced Semi-Supervised Learning under Class Distribution Mismatch

H. Lee, T. Park and H. Kim 

The IEEE/CVF International Conference on Computer Vision (ICCV) 2025.  [accepted]

Revisiting LLMs as Zero-Shot Time-Series Forecasters: Small Noise Can Break Large Models

J. Park, H. Lee, D. Lee, D. Gwak and J. Choo 

The 63rd Annual Meeting of the Association for Computational Linguistics (ACL) 2025. [paper]

Rebalancing Using Estimated Class Distribution for Imbalanced Semi-Supervised Learning under Class Distribution Mismatch

T. Park*, H. Lee*, and H Kim 

European Conference on Computer Vision (ECCV) 2024. [paper]

Classification of Chip-level Defect Types in Wafer Bin Maps Using Only Wafer-level Labels

H. Lee, H. Kim and H. Kim 

ASME Journal of Manufacturing Science and Engineering, 146(7): 070902 2024. [paper]

CDMAD: Class-Distribution-Mismatch-Aware Debiasing for Class-Imbalanced Semi-Supervised Learning

Hyuck Lee and H. Kim

The IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) 2024. [paper]

Semi-Supervised Learning for Simultaneous Location Detection and Classification of Mixed-Type Defect Patterns in Wafer Bin Maps

Hyuck Lee, J. Lee and H. Kim

IEEE Transactions on Semiconductor Manufacturing  36(2), 220-230  2023. [paper]

ABC: Auxiliary Balanced Classifier for Class-imbalanced Semi-supervised Learning

Hyuck Lee, S. Shin and H. Kim

Conference on Neural Information Processing Systems (NeurIPS) 2021. [paper]

Semi-Supervised Multi-Label Learning for Classification of Wafer Bin Maps With Mixed-Type Defect Patterns

Hyuck Lee and H. Kim

IEEE Transactions on Semiconductor Manufacturing, 33(4), 653-662  2020. [paper]

GPU Server Manager / Department of Industrial and Systems Engineering in KAIST (03. 2019 - 02. 2023)

Instructor for AI basic / Republic of Korea Air Force Academy (04. 10. 2022)

Academic Services / Served as Reviewer of AI Conferences

• 2025 ICCV Reviewer

• 2024 ICML Reviewer

• 2024 ICLR Reviewer

• 2023 NeurIPS Reviewer

• 2022 NeurIPS Reviewer

• 2022 ICML Reviewer

Tutor for Engineering Statistics II / Department of Industrial and Systems Engineering in KAIST (09. 2020 - 12. 2020)

Counseling Assistant / Department of Industrial and Systems Engineering in KAIST (03. 2018 - 02. 2019)

Internship / Dotname Corporation (06. 2017 - 08. 2017)

Vice General Planning Director / Future Industrial Engineering Leaders and Dreamers (FIELD) (08. 2016 - 07. 2017)

Student Council Secretary / Department of Industrial and Systems Engineering in KAIST (03. 2016 - 02. 2017)

Reading books and discussing / I am particularly interested in reading novels. (I am a fan of Milan Kundera ) 

Fitness activities / I especially enjoy running and cycling.