Hyuck Lee

Machine Learning Engineer

I'm working as a researcher in the AI research team at Krafton.  I completed my Ph.D program at the Industrial Statistics Lab (iStat Lab) of Korea Advanced Institute of Science and Technology (KAIST) advised by Prof. Heeyoung Kim. I'm majoring in artificial intelligence (AI).

Research Interests :  Long-tailed learning,  Semi-supervised learning,  Long-tailed semi-supervised learning,  Multi-Label Classification,  Classification of Defect Patterns on Wafer Bin Maps 

Contacts : dlgur0921@krafton.com

Education


KAIST / Ph.D. in Department of Industrial and Systems Engineering   03. 2020 - 08.2024
Under the supervision of Prof. Heeyoung Kim

KAIST / M.S. in Department of Industrial and Systems Engineering   03. 2018 - 02. 2020

Under the supervision of Prof. Heeyoung Kim


KAIST  / B.S. in Department of Industrial and Systems Engineering   03. 2014 - 02. 2018

Publications


Rebalancing Using Estimated Class Distribution for Imbalanced Semi-Supervised Learning under Class Distribution Mismatch

T. Park*, H. Lee*, and H. Kim 

European Conference on Computer Vision (ECCV) 2024, Milan, Italy, September 2024.  [accepted]


Classification of Chip-level Defect Types in Wafer Bin Maps Using Only Wafer-level Labels

H. Lee, H. Kim, and H. Kim 

ASME Journal of Manufacturing Science and Engineering, 146(7): 070902 2024. [paper]


CDMAD: Class-Distribution-Mismatch-Aware Debiasing for Class-Imbalanced Semi-Supervised Learning

Hyuck Lee and H. Kim

The IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) 2024. [paper]

Semi-Supervised Learning for Simultaneous Location Detection and Classification of Mixed-Type Defect Patterns in Wafer Bin Maps

Hyuck Lee, J. Lee and H. Kim

IEEE Transactions on Semiconductor Manufacturing  36(2), 220-230  2023. [paper]

ABC: Auxiliary Balanced Classifier for Class-imbalanced Semi-supervised Learning

Hyuck Lee, S. Shin and H. Kim

Conference on Neural Information Processing Systems (NeurIPS) 2021. [paper]

Semi-Supervised Multi-Label Learning for Classification of Wafer Bin Maps With Mixed-Type Defect Patterns

Hyuck Lee and H. Kim

IEEE Transactions on Semiconductor Manufacturing, 33(4), 653-662  2020. [paper]

Honors & Awards 

Song Hyun Award,  Department of Industrial and Systems Engineering in KAIST 2018

Dean’s List (Top 3%),  Faculty of Engineering Department in KAIST   2016 

National Excellence Scholarship, Korea Scholarship Foundation 2016

Services 

GPU Server Manager / Department of Industrial and Systems Engineering in KAIST (03. 2019 - 02. 2023)

Instructor for AI basic / Republic of Korea Air Force Academy (04. 10. 2022)

Academic Services / Served as Reviewer of AI Conferences

Tutor for Engineering Statistics II / Department of Industrial and Systems Engineering in KAIST (09. 2020 - 12. 2020)

Counseling Assistant / Department of Industrial and Systems Engineering in KAIST (03. 2018 - 02. 2019)

Internship / Dotname Corporation (06. 2017 - 08. 2017)

Vice General Planning Director / Future Industrial Engineering Leaders and Dreamers (FIELD) (08. 2016 - 07. 2017)

Student Council Secretary / Department of Industrial and Systems Engineering in KAIST (03. 2016 - 02. 2017)

Other interests 

Reading books and discussing / I am particularly interested in reading novels. (I am a fan of Milan Kundera ) 

Fitness activities / I especially enjoy running and cycling.