Research Methods and Techniques

Physicochemical characterization:

SEM (Scanning electron microscopy):  SEM analysis is a powerful investigative tool that produces complex, high-magnification images of a sample's surface topography using a focused beam of electrons.

TEM (Transmission electron microscopy):  TEM is a technique for imaging nanoparticle samples that uses an electron beam to provide much higher resolution than light-based imaging techniques. The preferred method for directly measuring nanoparticle size, grain size, size distribution, and morphology is transmission electron microscopy (TEM).

XRD (X-ray diffraction) : In materials research, X-ray diffraction analysis (XRD) is a technique used to identify and examine the crystalline nature, lattice parameters, and crystalline structure of a material.

Raman Spectroscopy: The field of vibrational spectroscopy includes Raman spectroscopy. By employing light to produce (excite) molecular vibration and analyzing the resulting interaction, it analyzes a sample chemically.

FTIR (Fourier transform infrared spectroscopy): Utilizing infrared light to scan the samples, FTIR analysis is used to identify organic, inorganic, and polymeric components. A change in the material composition is clearly shown by changes to the typical pattern of absorption bands. FTIR can be used to identify and characterize unknown materials, find additives, detect impurities in a material, and determine decomposition and oxidation.

Electrochemical Measurements: