Expertise in the single crystal growth of topological materials, including Bi2Se3, Bi2Te3, and various doped and intercalated systems of Bi2Se3, PdTe2, NiTe2, SnAs, SnSb2Te4, and SnBi2Te4 through solid state reaction routes.
-Deposition Techniques:
Proficient in depositing Bi2Se3 topological insulators using thermal evaporation and sputtering methods.
- Atomic Thin Layer Growth:
Skilled in the growth of atomic thin layers of graphene, fluorographene, and 2D materials such as MoS2, MoSe2, and MoSSe using chemical vapor deposition (CVD).
-Metasurface Fabrication:
Experienced in fabricating metasurfaces utilizing photolithography techniques.
-Thin Film Battery Fabrication:
Competent in the fabrication of solid-state thin film batteries (LiCoO2/Li3PO4/Li) using pulsed laser deposition.
Schematic diagram showing the steps of growing single-crystalline topological materials before putting them for optimized heat treatment
Illustrative representation of my research findings showed through a laboratory-cultivated single crystal of Bi2Se3 (JALCOM, 886, 161235), and the wet transfer procedure highlighting the transfer of monolayer of MoS2 over Bi2Se3 for the formation of a heterostructure (ACS JPCC, 127(12), 5958-5967)
Hands-On Experience
-Spectroscopy Techniques:
Proficient in transient pump-probe spectroscopy, electrochemical impedance spectroscopy, secondary ion mass spectroscopy, UV-VIS-IR spectroscopy, photoluminescence spectroscopy, and Raman spectroscopy.
-Material Characterization Tools:
Skilled in using the Physical Property Measurement System (PPMS) and performing maskless lithography, pulsed laser deposition, and sputtering deposition.
Transient ultrafast spectroscopy setup at CSIR-NPL shows various components, including a chiller, dehumidifier, mode-locked laser, amplifier, spectrometer, and temperature-controlled chamber
Schematic of Ultrafast transient reflectance spectroscopy (TRUS).
PPMS
A physical property measurement system (PPMS) is a versatile technique that can measure numerous transport properties. This single system investigates the heat capacity, electrical & thermal properties, DC resistivity measurements, I-V curve measurement, AC & DC magnetization, Hall effect, thermoelectric figure of merit (ZT), Seebeck effect, and AC & DC magnetic susceptibility of material. It is an advanced automated system that can precisely go from 1.8 to 400 K and has a magnetic field of ±14 Tesla..
Schematic of Quantum design PPMS
Software/Computational Skills:
- 3D EM Simulation:
Advanced proficiency in CST Studio Suite for 3D electromagnetic simulation and analysis.
-Crystallographic Analysis:
Skilled in Rietveld refinement using FullProf software and VESTA for crystal structure visualization.
-Lifetime Analysis:
Experienced in using Surface Xplorer for determining carrier lifetimes.