Publications

[1] IEEE International Solid-State Circuits Conference (ISSCC), 2025, Accepted.

SPAD Flash LiDAR with Chopped Analog Counter for 76m Range and 120klx Background Light

H.-S. Choi, I. Park, B. Park, D. Cho, M.-J. Lee, and Y. Chae

[2] IEEE Symposium on VLSI Technology and Circuits, June 2024.

A 7.2inch 5.5Mpixel 600mW SPAD X-ray Detector with 116.7 dB Dynamic Range [link]

B. Park, H.-S. Choi, J. Jeong, J. Cheon, M.-J. Lee, and Y. Chae

[3] IEEE Symposium on VLSI Technology and Circuits, June 2024. 

A 30fps 64x64 CMOS Flash LiDAR Sensor with Push-Pull Analog Counter Achieving 0.1% Depth Uncertainty at 70m Detection Range [link]

D. Cho, B. Park, H.-S. Choi, M.-J. Lee, and Y. Chae

[4] IEEE Journal of Solid-State Circuits (JSSC), vol. 58, no. 11, pp. 2965 - 2975, Nov. 2023.

A 113.3 dB Dynamic Range 600 frames/s SPAD X-ray Detector with Seamless Global Shutter and Time-Encoded Extrapolation Counter [link]

B. Park, H.-S. Choi, J. Jeong, K. Hwang, T. Kim, M.-J. Lee, and Y. Chae

[5] IEEE Journal of Solid-State Circuits (JSSC), vol. 59, no. 4, pp. 1017-1025, April 2024. 

A Highly Digital 143.2-dB DR Sub-1° Phase Error Impedance Monitoring IC with Pulse-Width Modulation Frontend [link]

H. Han, B. Park, J. Sung, H.-J. Choi, and Y. Chae

[6] IEEE International Solid-State Circuits Conference (ISSCC), pp. 100-102, Feb. 2023.

A 400x200 600fps 117.7dB-DR SPAD X-ray Detector with Seamless Global Shutter and Time-Encoded Extrapolation Counter [link]

B. Park, B. Ahn, H.-S. Choi, J. Jeong, K. Hwang, T. Kim, M.-J. Lee, and Y. Chae

[7] IEEE Journal of Solid-State Circuits (JSSC), Vol. 56, No. 10, pp. 2956-2967, Oct 2021.

A  64 × 64 SPAD-based Indirect Time-of-Flight Image Sensor with 2-tap Analog Pulse Counters  [link]

B. Park, I. Park, C. Park, W. Choi, Y. Na, M.-J. Lee, and Y. Chae

[8] IEEE Solid-State Circuits Letters (SSC-L), Vol. 3, pp. 422-425, Nov. 2020. A-SSCC special Issue.

A 40m-Range 90fps CMOS Time-of-Flight Sensor using SPAD and In-Pixel Time-Gated Pulse Counter [link] 

B. Park, I. Park, W. Choi, Y. Na and Y. Chae

[9] IEEE Symposium on VLSI Circuits (SOVC), June 2019, pp. C256-257. 

A 64×64 APD-Based ToF Image Sensor with Background Light Suppression up to 200 klx Using In-Pixel Auto-Zeroing and Chopping [link] 

B. Park, I. Park, W. Choi and Y. Chae

[10] IEEE Journal of Solid-State Circuits (JSSC), Vol. 55, No. 4, pp. 898-907, Apr. 2020. 

A 640×640 Fully Dynamic CMOS Image Sensor for Always-On Operation [link] 

I. Park, W. Jo, C. Park, B. Park, J. Cheon and Y. Chae

[11] IEEE Symposium on VLSI Circuits (SOVC), June 2019, pp. C214-215. 

A 640×640 Fully Dynamic CMOS Image Sensor for Always-On Object Recognition [link] 

I. Park, W. Jo, C. Park, B. Park, J. Cheon and Y. Chae

[12] Optics Express, 30 (9), 14958-14965.

Noise Optimization of Single-Photon Avalanche Diodes Fabricated in 110 nm CMOS Image Sensor Technology  [link]

W. Y. Ha, E. Park, B. Park, Y. Chae, W.-Y. Choi, and M.-J. Lee

[13] IEEE Tran. on Electron Devices (TED), vol. 66, issue. 7. pp. 2986-2991, July, 2019. 

The Effect of a Deep Virtual Guard Ring on the Device Characteristics of Single Photon Avalanche Diodes [link] 

D. Shin, B. Park, Y. Chae, and I. Yun

[14] Microelectronics Reliability, vol. 76-77, pp. 610-613, Sept, 2017.

Structure Variation Effects on Device Reliability of Single Photon Avalanche Diodes [link] 

D. Shin, B. Park, Y. Chae and I. Yun