1. Tseng, S. T.*, Balakrishnan, N., and Tsai, C. C. (2009), “Optimal Step-Stress Accelerated Degradation Test Plan for Gamma Degradation Processes,” Mathematical Methods in Reliability, Moscow, Russia, Jun. 22-27.
2. Tseng, S. T., Balakrishnan, N., and Tsai, C. C.* (2009), “Optimal Step-Stress Accelerated Degradation Test Plan for Gamma Degradation Processes,” Proceedings of the Eighth ROC Symposium on Reliability and Maintainability, Yunlin, Taiwan, Dec. 3-4.
3. Tsai, C. C.*, Tseng, S. T., and Balakrishnan, N. (2010), “Optimal Burn-In Policy for Highly Reliable Products using Gamma Degradation Process,” The 19th South Taiwan Statistics Conference and 2010 Cross-Strait Conference on Probability and Statistics, Tainan, Taiwan, Jul. 6-7.
4. Tsai, C. C.*, Tseng, S. T., and Balakrishnan, N. (2010), “Optimal Burn-In Policy for Highly Reliable Products using Gamma Degradation Process,” Mathematical Conference and Annual Meeting of the Taiwan Mathematical Society, Changhua, Dec. 10-12.
5. Tsai, C. C., Tseng, S. T., and Balakrishnan, N.* (2011), “Gamma Degradation Model and Related Issues,” The 14th Conference of the Applied Stochastic Models and Data Analysis International Society, Rome, Italy, Jun. 7-10.
6. Tseng, S. T., Tsai, C. C.*, and Balakrishnan, N. (2011), “Optimal Sample Size Allocation for Accelerated Degradation Test based on Wiener Process,” The 20th South Taiwan Statistics Conference and 2011 Conference on Probability and Statistics, Chiayi, Taiwan, Jun. 24-25.
7. Tsai, C. C. *, Tseng, S. T., and Balakrishnan, N. (2011), “Optimal Design for Gamma Degradation Processes with Random Effects,” International Conference on Advances in Probability and Statistics - Theory and Applications, Hong Kong, Dec. 28- 31. [NSC 100-2118-M-032 -013]
8. Tsai, C. C., Tseng, S. T*., and Balakrishnan, N. (2012), “Optimal Design for Gamma Degradation Processes with Random Effects,” Statistical Models and Methods for Reliability and Survival Analysis and Their Validation, Bordeaux, Jul. 4-6.
9. Tsai, C. C.*, Tseng, S. T., and Balakrishnan, N. (2012), “Optimal Design for Gamma Degradation Processes with Random Effects,” The Second International Conference on the Interface between Statistics and Engineering, Tainan, Jun. 23-25. [NSC 100-2118-M-032 -013]
10. Tsai, C. C.*, Tseng, S. T., and Balakrishnan, N. (2012), “Optimal Design for Gamma Degradation Processes with Random Effects,” The 21th South Taiwan Statistics Conference, Taipei, Taiwan, Jun. 29-30. [NSC 100-2118-M-032 -013]
11.Tsai, C. C.*, Tseng, S. T., Balakrishnan, N., and Lin, C. T. (2013), “Optimal Design for Accelerated Destructive Degradation Test,” 第八屆-海峽兩岸數學研討會, 北京, Apr. 22-23. [NSC 101-2118-M-032 -007]
12. Tsai, C. C.*, Tseng, S. T., Balakrishnan, N., and Lin, C. T. (2013), “Optimal Design for Accelerated Destructive Degradation Test,” 2013 Joint Statistical Meetings, Montreal, Quebec, Canada, Aug. 3-8. [NSC 101-2118-M-032 -007]
13. Tsai, C. C.*, Tseng, S. T., Balakrishnan, N., and Lin, C. T. (2014), “Optimal Design for Accelerated Destructive Degradation Test,” 第九屆海峽兩岸機率與統計學術研討會, Taichung, Taiwan, May 16-18. [NSC 102-2118-M-032 -001]
14. Tsai, C. C.*, Tseng, S. T., Balakrishnan, N., and Lin, C. T. (2014), “Optimal Design for Accelerated Destructive Degradation Test,”智慧科技與應用統計研討會, Department of Applied Statistics and Information Science, Ming Chuan University, Taiwan, May 24.
15. Tsai, C. C.*, Lin, C. T. (2014), “Optimal Selection of the Most Reliable Design Based on Gamma Degradation,” The 3rd Institute of Mathematical Statistics Asia Pacific Rim Meeting, Taipei, Taiwan, June. 29- July 3. [NSC 102-2118-M-032 -001] (A Session Chair)
16. Tsai, C. C.*, Lin, C. T. (2014), “Optimal Selection of the Most Reliable Design Based on Gamma Degradation,” 6th Asia-Pacific International Symposium on Advanced Reliability and Maintenance Modeling (APARM 2014), Sapporo, Japan, August 21-23. [NSC 102-2118-M-032 -001] (with A Session Chair)
17. Tsai, C. C., Balakrishnan, N.*, and Lin, C. T. (2014), “Optimal Design for Accelerated-Stress Acceptance Test Based on Wiener Process,” 5th International Conference on Accelerated Life Testing and Degradation Models (ALT2014), Pau, France, Jun. 11-13. [NSC 102-2118-M-032 -001]
18. Tsai, C. C.*, Balakrishnan, N., and Lin, C. T. (2014), “Optimal Design for Accelerated-Stress Acceptance Test Based on Wiener Process,” 2014 International Statistical Symposium (CSA-KSS-JSS Special Invited Sessions), National Chiao Tung University, Dec. 6. [MOST 103-2118-M-032-002-] (with A Session Chair)
19. Tsai, C. C.*, Balakrishnan, N., and Lin, C. T. (2015), “Optimal Design for Accelerated-Stress Acceptance Test Based on Wiener Process,”智慧科技與應用統計研討會, Department of Statistics,Tamkang University, Taiwan, May 30. [MOST 103-2118-M-032-002-]
20. Tsai, C. C.*, Balakrishnan, N., and Lin, C. T. (2015), “Optimal Design for Accelerated-Stress Acceptance Test Based on Wiener Process,” 2015 Joint Statistical Meetings, Seattle, USA, Aug. 8-13. [MOST 103-2118-M-032-002-]
21. Tsai, C. C.* and Lin, C. T. (2015), “Lifetime Inference for Highly Reliable Products Based on Skew-Normal Accelerated Destructive Degradation Test Model,” 2015 統計學術研討會, Department of Statistics, National Taipei University, Dec. 4. [MOST 104-2118-M-032-012 -]
22. Tsai, C. C.* and Lin, C. T. (2016), “Statistical Lifetime Inference based on Skew-Normal Accelerated Destructive Degradation Test Model,” 2016 Joint Statistical Meetings, Chicago, USA, Jul. 30-Aug. 4. [MOST 104-2118-M-032-012 -]
23. Tsai, C. C.*, Balakrishnan, N., and Lin, C. T. (2017), “A Study on Accelerated-Stress Acceptance Test,” 2017 統計學門研究成果發表會, Departments of Applied Mathematics, National Chung Hsing University, Taiwan, Feb. 7-8. [MOST 105-2118-M-032-008 -]
24. Tsai, C. C.* and Lin, C. T. (2017), “Statistical Lifetime Inference based on Skew-Normal Accelerated Destructive Degradation Test Model,” 第十三屆海峽兩岸應用統計學術研討會暨台灣智慧科技與應用統計學會年會, Tunghai University, Taiwan, Apr. 23-24. [MOST 105-2118-M-032-008 -]
25. Tsai, C. C.* (2017), “Statistical Inferences and Optimal Designs based on Gamma Processes,” International Seminar on Stability Problems for Stochastic Models, Debrecen, Hungary, Aug. 25-29. [MOST 105-2118-M-032-008 -] (Poster)
26. Tsai, C. C.* (2017), “Modeling and Application on Non-destructive and Destructive Degradation Tests,” Joint Conference on Biometrics & Biopharmaceutical Statistics, Vienna, Austria, Aug. 28 – Sep. 1. [MOST 105-2118-M-032-008 -] (Poster)
27. Tsai, C. C.* (2018), “Solar Panel Lamination with Extreme Value Regression Model,” 第十一屆海峽兩岸統計與機率學術研討會, National Taipei University, Taiwan, May 31- Jun. 2. [MOST 106-2118-M-032-009 -]
28. Tsai, C. C.* (2018), “Solar Panel Lamination with Extreme Value Regression Model,” 2018 Joint Statistical Meetings, Vancouver, Canada, Jul. 28-Aug. 2. [MOST 106-2118-M-032-009 -]
29. Tsai, C. C.* (2018), “Solar Panel Lamination with Extreme Value Regression Model,” 107年統計學術研討會暨中央大學統計所40週年國際學術研討會, National Central University, Taiwan, Nov. 9-10. [MOST 107-2118-M-032-010 -]
30. Tsai, C. C.* (2019), “Lamination Design of Photovoltaic Solar Panels,” 第二十八屆南區統計研討會, National Chung Hsing University, Taiwan, Jun. 21-22. [MOST 107-2118-M-032-010 -]
31. Tsai, C. C.* (2019), “Lamination Design of Solar Panels based on Extreme Value Models,” 11th international conference on Extreme Value Analysis, Zagreb, Croatia, Jul. 1-5. [MOST 107-2118-M-032-010 -]
32. Tsai, C. C.* (2019), “Lamination Design of Solar Panels based on Extreme Value Models,” 34th International Workshop on Statistical Modelling, Guimarães, Portugal, Jul. 7-12. [MOST 107-2118-M-032-010 -] (Poster)
33. Tsai, C. C.* and Lin, C. T. (2019), “Lifetime Inference for Highly Reliable Products Based on Skew-Normal Accelerated Destructive Degradation Test Model,” 108年中國統計學社社員大會暨統計學術研討會, National Chiao Tung University, Taiwan, Dec. 14. [MOST 108-2118-M-032-003 -]
33. Tsai, C. C.* and Lin, C. T. (2019), “Lifetime Inference for Highly Reliable Products Based on Skew-Normal Accelerated Destructive Degradation Test Model,” 108年中國統計學社社員大會暨統計學術研討會, National Chiao Tung University, Taiwan, Dec. 14. [MOST 108-2118-M-032-003 -]
34. Tsai, C. C.*, Balakrishnan, N., and Lin, C. T. (2020), “Optimal Design for Accelerated-Stress Acceptance Test,”2020年中華民國數學年會, Department of Mathematics, Fu-Jen Catholic University, Taiwan, Dec. 5-6. [MOST 109-2118-M-032-005 -]
35. Tsai, C. C.* (2021), “Lamination Design of Photovoltaic Solar Panel,” 海峽兩岸機率與統計學術研討會, Department of Statistics, National Chengchi University, Jul. 31. [MOST 109-2118-M-032-005 -]
36. Tsai, C. C.* (2022), “Recent Developments and Applications of Inference and Design in Degradation Tests, 2022 Workshop on Advances in Reliability, Institute of Statistical Science Academia Sinica, Taiwan, Nov. 17-18. [MOST 111-2118-M-032-007-]
37.Tsai, C. C.* Lin, C. T., and Balakrishnan, N. (2022), “Lamination Scheme of Curing Degree at Multiple Levels of Temperature with Location-scale Regression,” 111年統計學術研討會, Department of Statistics, Tamkang University, Taiwan, Dec. 9. [MOST 111-2118-M-032-007 -]
1. Tsai, C. C.*, Tseng, S. T., and Balakrishnan, N. (2011), “Optimal Burn-In Policy for Highly Reliable Products using Gamma Degradation Process,” Department of Mathematics, National Chung Cheng University, Mar. 9.
2. Tsai, C. C.*, Tseng, S. T., and Balakrishnan, N. (2011), “Design and Analysis of Gamma Degradation Process,” Department of Statistics, National Taipei University, Mar., 16.
3. Tsai, C. C.*, Tseng, S. T., and Balakrishnan, N. (2011), “Optimal Burn-In Policy for Highly Reliable Products using Gamma Degradation Process,” Department of Statistics, National Chengchi University, Mar. 21.
4. Tsai, C. C.*, Tseng, S. T., and Balakrishnan, N. (2011), “Optimal Burn-In Policy for Highly Reliable Products using Gamma Degradation Process,” Department of Mathematics, Tamkang University, Mar. 29.
5. Tsai, C. C.*, Tseng, S. T., Balakrishnan, N., and Lin, C. T. (2013), “Optimal Design for Accelerated Destructive Degradation Test,” The 5th Workshop on Quality Management, Department of Statistics and Informatics Science, Providence University, May 23.
6. Tsai, C. C.*, Tseng, S. T., Balakrishnan, N., and Lin, C. T. (2013), “Optimal Design for Accelerated Destructive Degradation Test,” Institute of Statistical Science, Academia Sinica, Taiwan, Jan. 21.
7. Tsai, C. C.*, Tseng, S. T., Balakrishnan, N., and Lin, C. T. (2014), “Optimal Design for Accelerated Destructive Degradation Test,” Institute of Statistics, National University Kaohsiung, Taiwan, Mar. 12.
8. Tsai, C. C.*, Balakrishnan, N., and Lin, C. T. (2015), “Optimal Design for Accelerated-Stress Acceptance Test,” Department of Applied Statistics and Information Science, Ming Chuan University, Nov. 6. [MOST 104-2118-M-032-012 -]
9. Tsai, C. C.* and Lin, C. T. (2016), “Statistical Lifetime Inference based on Skew-Normal Accelerated Destructive Degradation Test Model,” Graduate Institute of Statistics, National Central University, Mar. 1. [MOST 104-2118-M-032-012 -]
10. Tsai, C. C.*, Balakrishnan, N., and Lin, C. T. (2016), “A Study on Accelerated-Stress Acceptance Test,” Departments of Applied Mathematics, Chung Yuan Christian University, Oct. 14. [MOST 104-2118-M-032-012 -]
11. Tsai, C. C.* and Lin, C. T. (2017), “Lifetime Inference for Highly Reliable Products Based on Skew-Normal Accelerated Destructive Degradation Test Model,” Departments of Applied Mathematics,Chung Yuan Christian University, May 10. [MOST 105-2118-M-032-008 -]
12. Tsai, C. C.* (2017), “生活中的數字與統計,” Department of Finance and Actuarial Science, Aletheia University, Oct. 12. [MOST 106-2118-M-032-009 -]
13. Tsai, C. C.* (2018), “Solar Panel Lamination with Extreme Value Regression Model,” Departments of Applied Mathematics, Chung Yuan Christian University, May 18. [MOST 106-2118-M-032-009 -]
14. Tsai, C. C.* (2018), “Solar Panel Lamination with Extreme Value Regression Model,” Department of Applied Statistics and Information Science, Ming Chuan University, Sep. 28. [MOST 106-2118-M-032-009 -]
15. Tsai, C. C.* (2020), “Lamination Design of Photovoltaic Solar Panels,” Institute of Statistical Science Academia Sinica, Sep. 28. [MOST 109-2118-M-032-005 -]
Visiting Professor, School of Management, Tokyo University of Science, Japan. (112.7.16~112.7.26) [MOST 110-2118-M-032-006]