The guide block system was designed so that the change of the relative dimension of the cubic compression space with press load can be minimized by repeated adjustments. The hydraulic system was designed so as to enable smooth compression and decompression. These precise controls should be advantageous for high-pressure generation, especially when sintered diamond (SD) anvils are used. An oscillation system was equipped for the first time in a large volume press, making it possible to obtain high-quality diffraction patterns even when the number of sample grains is limited. The use of the oscillation system also reduces errors in pressure determination that may be caused by insufficient averaging of diffraction angles over grains in a limited diffraction volume, because the oscillating grains should sweep through the 2θ range that is allowed by the finite widths of the optical slits.

When D-rams are not used, this guide block works as DIA type guide blocks. Maximum laod of this guide block is 15 MN.  maximum pressure is up to 65 GPa with WC second anviles and 120 GPa with sintered diamond second anviles. When we used D-rams with 6-6 type cell as deformation appratus, sample could be deformed up to 20 GPa.

This guildblock is specifited to deformation experiments with Kawai-type (6-8 type) cell assembly.

Maximum Load is ~ 7 MN. Deformation expmeriments are perfomred up to 30 GPa.

A white X-ray beam from the bending magnet light source is collimated with vertical and horizontal slits to form a thin beam possessing a cross section of typically 0.05 x 0.1 mm2. In order to carry out the energy-dispersive X-ray diffraction on the Kawai-type system, the first-stage anvils are cut holes to pass the X-ray beam. The incident white X-ray beam from the first-stage passes through the gaps between the second-stage anvils in a horizontal plane. X-rays diffracted by samples under high-pressure and high-temperature is detected by a pure Ge solid state detector (Ge-SSD) with a 4096 multi-channel analyzer. Diffraction data can be obtained with an energy range from 20 to 150 keV. Use of a collimator (0.05 mm width) and a receiving slit at a fixed angle to the direct beam permits only the diffracted X-rays from the sample to be detected. The horizontal goniometer covers a range of 2θ angles from -10 to 23° with an accuracy of 0.0001°. The X-ray acquisition time to obtain a diffraction profile is typically one to several minutes.