Load: 0.5 to 5000 N

Motion direction: Linear reciprocating, unidirectional, or custom

Speed: Linear up to 5 mm/s and unidirectional up to 5000 RPM

Temperature: RT to 500 °C

Geometry: Ball or pin on flat or disk, conformal contact linear reciprocation, or custom

Lubrication: From dry to full film lubrication; custom set up for grease testing

Environment: Ambient or controlled gas (usually N2)

4-ball test

Ball-on-disk

Ambient (N2 capability being developed)

Custom low-speed friction tester for brake and clutch tests (various capabilities)

Custom profilometry capability

One Nanovea and one onboard the Rtec tribometer

This environmental scanning electron microscope has a tungsten filament and EDAX Genesis energy-dispersive X-ray spectrometer 30mm2 detector with 132 eV resolution. 

The microscope has 4 nm spatial resolution and can detect characteristic X-rays down to and including beryllium, although sensitivity is limited for light elements.

Gemini beam-booster technology guarantees small probe sizes and high signal-to-noise ratios, right down to very low accelerating voltages.

Thermal field emission gun type: stability better than 0.2%/h

Acceleration voltage: 0.02 - 30kv

Probe current: 3pA to 20nA

Store resolution: Up to 32k x 24k pixels

Detectors:

• 1. • Inlens Secondary Electron Detector (Inlens)

     • Everhart Thornley Secondary Electron Detector (SE2)

     • Inlens Energy Selected Backscatter Detector (EsB)

This instrument measures surface profiles using a stylus that can detect changes in profile down to a few angstroms. 

Reciprocating Friction and Wear MonitorTR 281 M fretting wear testing machine programmed with Winducom 2006-upgrade software

Scanning Electron Microscope is a versatile analytical microscope with a large specimen chamber and can handle large specimens at the analytical working distance of 8.5mm owing to a combination of the inclined detectors and the sharp conical objective lens.

Microstructures at SEM can be analyzed for its elemental composition in more detail using EDX system. 

This is a non-destructive analysis and the elements and their concentration in the sample can be determined reasonably accurately. 

EDS (EDX) Analysis provides elemental/Phase composition analysis of a sample inside a SEM. 

Also microstructural analysis i.e. EBSD (Electron BackScatter Diffraction Analysis) can be done to characterize grain structures. 

INCA and AZtec from Oxford is a new and revolutionary materials characterization system that gathers accurate data at the micro- and nanoscales.

Nano-indentation module

Integrated with Atomic Force Microscopy Capability

Nanoscratch module

Heating Control Capability