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Title: Chemical State Imaging of Battery Materials by Advanced Synchrotron X-ray Spectromicroscopy
Keywords: X-ray Spectro Ptychography, TXM-XAFS, Battery active material, Operando measurements, NanoTerasu
Abstract: In recent years, synchrotron radiation X-ray microspectroscopy has become increasingly important in order to observe and understand the properties and reactions of materials. Among them, X-ray Ptychography is an imaging method that takes advantage of the coherent nature of X-rays and takes full advantage of the light source capabilities of SPring-8 and NanoTerasu. By varying the incident energy, spatially-resolved XAFS spectra can be obtained, which enables real-space visualization of chemical state information inside bulk samples with high spatial resolution in the nm to μm scale. In this talk, we will report the results of our research on the measurement and analysis of X-ray spectroscopic Ptychography methods and the investigation of potential correlations between chemical states and material functions, with a focus on battery materials.
Related Papers
Towards sub-10 nm spatial resolution by tender X-ray ptychographic coherent diffraction imaging https://doi.org/10.35848/1882-0786/ad4846
Visualization of Structural Heterogeneities in Particles of Lithium Nickel Manganese Oxide Cathode Materials by Ptychographic X-ray Absorption Fine Structure https://doi.org/10.1021/acs.jpclett.1c01445
Comprehensive Operando Visualization of the Electrochemical Events in the Cathode/Anode Layers in Thin-Film-Type All-Solid-State Lithium-Ion Batteries https://doi.org/10.1021/acsaem.3c01441
Development of Operando Hard X-ray Ptychography: Application to Thin-Film All-Solid-State Lithium-Ion Batteries https://doi.org/10.1021/acs.jpcc.4c08299
