國立中央大學統計所
Prof. Yili Hong
Department of Statistics
Virginia Tech
東海大學統計學系
Title and Abstract
Keynote Speaker: 樊采虹教授
A Complete Bayesian Degradation Analysis Based on Inverse Gaussian Processes
Speaker: Prof. Yili Hong
Reliability Study of Battery Lives: A Functional Degradation Analysis Approach
Speaker: 俞一唐教授
Log-Location-Scale Increments Degradation Models