X-Ray Diffraction (XRD) 

The Instrument:

X-Ray powder diffraction (XRD) is a high-tech & non-destructive technique primarily used for phase identification of a crystalline materials. It can provide information on unit cell dimensions. It is designed for the structural characterization of the full range of materials from bulk materials, powders, amorphous and polycrystalline materials to epitaxial multi-layered thin films at ambient and non-ambient conditions.

Make: Anton Paar                                                                                                      

Model: XRDynamic 500   

Features and Specification:

• •   Source type: Primux 3000

  • X Ray generator: upto 3Kw

  •  Minimum step size: 0.0001°

  • 2θ linearity: ≤ 0.01°

  •  Sample stages: ambient and non-ambient sample stages

  • X-Ray reflectometry, Grazing Incidence Diffraction (GID), High-resolution XRD, 

Applications:

• Identification of unknown crystalline compounds.

• Characterization of crystalline material.

• Determining thickness, roughness and density of thin films.

• Information on nano scale particles, discorded materials, thin-films coatings, polymers, catalysts, plastics, pharmaceuticals, ceramics, solar cells, semiconductors, corrosion products etc.

• Micro diffraction on very small spots.

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