- Synthesis and characterization of Lead free high temperature piezo and ferroelectric materials
Synthesis and calcination : Solid State reaction method
Compaction: Uni-axial pressing and Cold isostatic pressing
Sintering : Microwave sintering and conventional sintering
Characterizations:
- Structural and Micro structural: Density measurement, XRD, FESEM, TEM and EDS
- Optical properties: Raman Spectrometer, Uv-Vis-NIR photo spectrometer
- Dielectric, Piezo and ferroelectric properties: Dielectric and Impedance spectrometer, d33 measurement, P-E loop measurement
- Growth and characterization of ferroelectric thin films for microwave device applications
Growth methods: Pulsed Laser deposition (PLD) and DC/R F magnetron sputtering system
Annealing : Microwave ,conventional and Insitu annealing
Characterization:
- Structural and Microstructural: Profilometer, GI-XRD, FESEM, TEM and EDS
- Optical properties: Raman Spectrometer, Uv-Vis-NIR photo spectrometer
- Dielectric and ferroelectric properties: Dielectric and Impedance spectrometer , P-E loop measurement
Future prospectus:
- Ferroelectric nanostructures
- Topological insulators
- Multiferroics and applications
- Ferroelectrics for energy sector applications
- Multilayer based thin film devices