The analysis chamber of SmartLab system hosts a conventional XPS setup composed by a monochromatised Al Ka x-ray source and a hemispherical electrostatic analyser.

The X-Ray source is a XR-MF50 by Specs, achieving the following target

• Photon energy: 1486.67 eV

• X-ray source energy resolution: 1.22 meV FWHM

• Count rate: 500 kcps @ 1 eV FWHM resolution on Ag (poly) 3d5/2

• Spot size: 270 microns

This chamber is also equipped with a Flood gun for charge compensation in insulating specimens.

• Electron energy: 0-500 eV

• Electron emission current: 1uA - 5 mA

A hemispherical electron analyser PHOIBOS 150 is used to analyse the kinetic energy of the emitted electrons

• CMOS detector Flir Camera

• Energy resolution: 5.3 meV FWHM @ 1.5 eV pass energy on Xe 5p3/2

• Different lens modes: Large/Medium/small area; Angular resolution and High Magnification (mapping)

• Variable Iris for energy and spatial resolution

• Selectable exit and entrance slits to tune both energy and spatial resolution

An external camera allows for visual inspection of the sample