Team

Prof. Veera Sundararaghavan (University of Michigan): Project lead, ICME/Fatigue Modeling

Prof. Lei Chen: University of Michigan, Microstructure modeling, phase field models

Shuchi “SK” Khurana: Addiguru,  Development of AI-based Multi-modal Defect Detection Package

Prof. Boris Kramer: University of California San Diego, UQ, Statistical Risk Assessment, Sensitivity Analysis.

Prof. Andani, Texas A&M,
Materials Characterization

Prof. Karaman, Texas A&M,
Materials Characterization

Prof. Arroyave, Texas A&M
Process Modeling

Prof. Elwany, Texas A&M, Process monitoring and UQ

Prof. Nima Shamsaei, Auburn, Fatigue and Fracture testing

Prof. Shuai Shao, Auburn, Fatigue and fracture testing

Dr. Harsh Baid, Alphastar, Physics based process modeing with feedback

Dr. Martin White, ASTM, Technical Specification 

Dr. Mohsen Seifi, ASTM, Technical Specification 

Dr. Yulin Gao, UCSD, Post doc, Prof Kramer group