Features

• This SmartLab was commisioned on 2019 and is located at Bangunan Low Dimensional Research Centre (J20)

• Dedicated for thin film analysis

• Profile Measurement Technique: Bragg-Brentano (BB), Parallel Beam (PB), In-plane XRD

• Thickness Evaluation: XRR, HR Rocking Curve

• Crystal Quality Analysis: Rocking Curve, Reciprocal Space Map