EQUIPMENT

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NTEGRA SPECTRA II – VERSATILE AUTOMATED AFM-Raman, SNOM AND TERS SYSTEM

  • High-performance versatile AFM
  • Automated AFM laser, probe and photodiode alignment
  • Integration with IR s-SNOM
  • Investigation of graphene, carbon nanotubes and other carbon materials; semiconductor devices; cellular tissue, DNA, viruses and other biological objects
  • Optical device characterization: semiconductor lasers, optical fibers, waveguides, plasmonic devices

MST 4000A 4” PROBE STATION

  • Leakage Current ~100 fA, accompanied by Option for using Hot Chuck
  • Chuck: 4 Inch Low Noise Chuck , On Ceramic Pad, Vacuum Chuck On/off Switch, Chuck Ground, Back Gate
  • Magnification: 90x
  • Probe Tip: M5BG, HR : 0.5 x 30mm Gold Tungsten or Tungsten; M3BGHR : 0.5 x 30mm Gold Tungsten

MICROMED 3 LUM LED

  • The set includes 4 fluorescent blocks (UV, V, B, G)
  • Images of objects in the light of visible luminescence, as well as in transmitted light in a bright field
  • Both transmitted and reflected light are emitted from LEDs
  • Magnification of 40 and 100 times

POTENTIOSTAT - GALVANOSTAT R-45X

  • 9 current ranges
  • 4 potential ranges (± 1V, ± 2V, ± 5V, ± 12V)
  • IR - positive feedback compensation
  • Pulse modes 2 μs
  • Combined cell shutdown method - high-speed CMOS switch and electromagnetic relay
  • Current resolution up to 1 pA
  • Potential resolution up to 40 μV
  • Minimum recommended operating current 200 pA


S150-2 SPECTROMETER

  • High spectral resolution (up to 9 pm)
  • Measurement of shape and width of the spectral line
  • High accuracy of wavelength determination (up to 1 pm)
  • Long-term stability. Fixed position of optical elements, small size
  • Automatic wavelength calibration. High accuracy and reproducibility of measurement results for the entire instrument lifetime
  • Easy-to-use software, possibility to solve non-standard problems