Embedded Files
NTEGRA SPECTRA II – VERSATILE AUTOMATED AFM-Raman, SNOM AND TERS SYSTEM
NTEGRA SPECTRA II – VERSATILE AUTOMATED AFM-Raman, SNOM AND TERS SYSTEM
- High-performance versatile AFM
- Automated AFM laser, probe and photodiode alignment
- Integration with IR s-SNOM
- Investigation of graphene, carbon nanotubes and other carbon materials; semiconductor devices; cellular tissue, DNA, viruses and other biological objects
- Optical device characterization: semiconductor lasers, optical fibers, waveguides, plasmonic devices
MST 4000A 4” PROBE STATION
MST 4000A 4” PROBE STATION
- Leakage Current ~100 fA, accompanied by Option for using Hot Chuck
- Chuck: 4 Inch Low Noise Chuck , On Ceramic Pad, Vacuum Chuck On/off Switch, Chuck Ground, Back Gate
- Magnification: 90x
- Probe Tip: M5BG, HR : 0.5 x 30mm Gold Tungsten or Tungsten; M3BGHR : 0.5 x 30mm Gold Tungsten
MICROMED 3 LUM LED
MICROMED 3 LUM LED
- The set includes 4 fluorescent blocks (UV, V, B, G)
- Images of objects in the light of visible luminescence, as well as in transmitted light in a bright field
- Both transmitted and reflected light are emitted from LEDs
- Magnification of 40 and 100 times
POTENTIOSTAT - GALVANOSTAT R-45X
POTENTIOSTAT - GALVANOSTAT R-45X
- 9 current ranges
- 4 potential ranges (± 1V, ± 2V, ± 5V, ± 12V)
- IR - positive feedback compensation
- Pulse modes 2 μs
- Combined cell shutdown method - high-speed CMOS switch and electromagnetic relay
- Current resolution up to 1 pA
- Potential resolution up to 40 μV
- Minimum recommended operating current 200 pA
S150-2 SPECTROMETER
S150-2 SPECTROMETER
- High spectral resolution (up to 9 pm)
- Measurement of shape and width of the spectral line
- High accuracy of wavelength determination (up to 1 pm)
- Long-term stability. Fixed position of optical elements, small size
- Automatic wavelength calibration. High accuracy and reproducibility of measurement results for the entire instrument lifetime
- Easy-to-use software, possibility to solve non-standard problems
Page updated
Report abuse