Delivering Made in Japan testing devices for every stage of semiconductor manufacturing, from design and validation to assembly.
Product Line up
Test Sockets
Contact Probe
Probe Cards
Cantilever probe card pin
Wire Probe
Lead Wire
Leadframe
Manual Prober
Catalouge:
We offer probe card pins manufactured in-house, from wire drawing and heat treatment to taper grinding and surface treatment, including insulation coating and plating. Our Cantilever probe card pins have a high-precision tapered shape, produced with our manufacturer's proprietary mechanical grinding process. This provides higher accuracy than conventional etched pins and enables the precision processing of precious metals that cannot be handled by etching. Pin materials include Tungsten, Rhenium Tungsten, Palladium Alloy, Beryllium Copper, and others.
Application Example
Continuity test of IC package board
Continuity testing of narrow pitch pattern printed circuit boards
Liquid crystal panel continuity test
Continuity inspection of various connectors
Kelvin resistance measurement of multilayer board (detection of false contact)
For semiconductor wafer inspection
Extra-fine plunger for spring probe, etc.
Japan, Osaka Head Office
Contact information: Shiwangi Tamang
Email: export@toho-intl.co.jp whatsapp/mobile number: +81 8037637039
Bangalore, India Branch office
Contact information: Mr. Dorai Arasu
Email: doraiarasu@toho-intl.co.jp whatsapp/mobile number: +91 9845405086