Chapters in Books:
Neha Garg, Yogesh Pratap, Mridula Gupta, Sneha Kabra, Impact of Trap Charges and High Temperature on Reliability of GaAs/Al2O3-Based Junctionless FinFET,pp 434- 440 , Computers and Devices for Communication, Part of the Lecture Notes in Networks and Systems book series (LNNS), volume 147, Springer, ISBN: 978-981-15-8366-7
Yogesh Pratap, S. Haldar, R. S. Gupta and Mridula Gupta, “Hot Carrier Reliability Issues of Junctionless Transistor due to Interface Trap Charges for Analog /RF Applications,” Physics of Semiconductor Devices, Environmental Science and Engineering, Springer, Cham. https://doi.org/10.1007/978-3-319-03002-9_76, ISBN: 978-3-319-03001-2
Publications in International Journals:
Yogesh Pratap, S. Haldar, R. S. Gupta and Mridula Gupta “Performance Evaluation and Reliability Issues of Junctionless CSG MOSFET for RFIC,” IEEE Transactions on Device and Materials Reliability, Vol. 14, no. 1, pp. 418-425, March 2014. (Impact Factor: 2.0)
Yogesh Pratap, Pujarini Ghosh, S. Haldar, R. S. Gupta and Mridula Gupta, "An analytical subthreshold current modeling of cylindrical gate all around (CGAA) MOSFET incorporating the influence of device design engineering,” Microelectronics Journal, Elsevier, Vol. 45, no. 4, pp. 408-415, April 2014. (Impact Factor: 2.2)
Yogesh Pratap, S. Haldar, R. S. Gupta and Mridula Gupta “Localized charge-dependent threshold voltage analysis of gate-material-engineered junctionless nanowire transistor" IEEE Transactions on Electron Devices, Vol. 62 (8), 2598-2605, 2015. (Impact Factor: 3.1)
J. H.K Verma, Yogesh Pratap, S. Haldar, R. S. Gupta and Mridula Gupta, “Capacitance Modeling of Gate Material Engineered Cylindrical/Surrounded Gate MOSFETs for Sensor Applications,” Superlattices and Microstructures, Elsevier, Vol. 88, pp. 271-280, December 2015. (Impact Factor: 3.1)
Yogesh Pratap, R. Gautum, S. Haldar, R. S. Gupta and Mridula Gupta, “Physics Based Drain Current Modeling of Gate-All-Around Junctionless Nanowire Twin-Gate Transistor (JN-TGT) for Digital Applications,” Journal of Computational Electronics, Springer, Vol. 15, no. 2, pp. 492-501, June 2016. (Impact Factor: 2.1)
A. Sharma, A. Jain, Yogesh Pratap, and R. S Gupta, “Effect of High-k and Vacuum Dielectrics as Gate Stack on a Junctionless Cylindrical Surrounding Gate (JL-CSG) MOSFET,” Solid State Electronics, Elsevier, Vol. 123, pp. 26-32, September 2016. (Impact Factor: 1.7)
Yogesh Pratap, S. Haldar, R. S. Gupta and Mridula Gupta “Gate Material Engineered Junctionless Nanowire Transistor (JNT) with Vacuum Gate Dielectric for Enhanced Hot Carrier Reliability,” IEEE Transactions on Device and Materials Reliability, Vol. 16, pp. 360-369, 2016. (Impact Factor: 2.0)
M. Kumar, Yogesh Pratap, S. Haldar, R. S. Gupta and Mridula Gupta “Cylindrical Gate All Around Schottky Barrier MOSFET with Insulated Shallow Extensions at Source/Drain for Removal of Ambipolarity: A Novel Approach,” Journal of Semiconductors, vol. 38, no.12, pp. 124002, 2018. (Impact Factor: 5.1)
Yogesh Pratap, M. Kumar, Sneha Kabra, S. Haldar, R. S. Gupta and Mridula Gupta “Analytical Modeling of Gate-All-Around Junctionless Transistor based Biosensor for Detection of Neutral Biomolecule Species,” Journal of Computational Electronics, Springer, vol. 17 (1), pp.288-296, 2018. (Impact Factor: 2.1)
Tushar Gauba, Yogesh Pratap, Sonam Rewari and R S Gupta, “Traps induced Greens function based mathematical modeling for BaTiO3–SrTiO3 gate stack dual metal GAA MOSFET” Semiconductor Science and Technology, Vol. 34, No. 11, October 2019. (Impact Factor: 1.9)
Praveen Pal, Yogesh Pratap, Mridula Gupta and Sneha Kabra, “Modeling and simulation of AlGaN/GaN MOS-HEMT for biosensor applications” IEEE Sensors Journal, vol. 19, no. 2, pp. 587-593, Jan. 2019. (Impact Factor: 4.3)
Neha Garg, Yogesh Pratap, Mridula Gupta and Sneha Kabra, “Impact of different localized trap charge profiles on the short channel double gate junctionless nanowire transistor based inverter and Ring Oscillator circuit” AEU - International Journal of Electronics and Communications, Volume 108, August 2019, Pages 251-261, ISSN: 1434-8411, 2019. (Impact Factor: 3.2)
Yogesh Pratap, and Jaihind Kumar Verma, “Temperature Dependent Performance Evaluation and Linearity Analysis of Double Gate-all-around (DGAA) MOSFET: an Advance Multigate Structure” Silicon- Springer, Vol 12, pp. 2619–2626, 2020. (Impact Factor: 3.2)
Neha Garg, Yogesh Pratap, Mridula Gupta and Sneha Kabra, “Reliability Assessment of GaAs/Al2O3 Junctionless FinFET in the presence of Interfacial layer defects and radiations” IEEE Transactions on Device and Materials Reliability. Volume: 20, Issue: 2, pp.452-458 June 2020, (Impact Factor: 2.0)
N. Garg, Yogesh Pratap, M. Gupta, and S. Kabra, “Dielectric Separated Independent Gates Junctionless Transistor (DSIG-JLT) For Highly Scaled Digital Logic Implementation,” IEEE Transactions on Nanotechnology, vol. 20, pp. 262–269, 2021, doi: 10.1109/tnano.2021.3066814. Impact Factor: 2.4
Praveen Pal, Yogesh Pratap, Mridula Gupta, and Sneha Kabra. “Analytical Modeling and Simulation of AlGaN/GaN MOS-HEMT for High Sensitive pH Sensor." IEEE Sensors Journal, Volume: 21, Issue: 12, June15, 2021. (Impact Factor: 4.3)
H. D. Sehgal, Yogesh Pratap, M. Gupta and S. Kabra, "Performance Investigation of novel Pt/Pd-SiO2 Junctionless FinFET as a high sensitive hydrogen gas sensor for Industrial applications," IEEE Sensors Journal, Volume: 21, Issue: 12, June15, 2021 . (Impact Factor: 4.3)
Praveen Pal, Yogesh Pratap, Mridula Gupta, and Sneha Kabra, “Open gate AlGaN/GaN HEMT biosensor Sensors: Sensitivity analysis and optimization” Elsevier Superlattices and Microstructures, Vol 156, pp-106968, 2021. (Impact Factor: 3.1)
Yogesh Pratap, Sachin Kumar, R.S. Gupta and Mridula Gupta, “Performance evaluation of dielectric modulation and metalloid T-shaped source/drain on gate-allaround junctionless transistor for improved analog/RF application” Springer Journal of Materials Science: Materials in Electronics, Vol 32, 10943-10950, 2021. (Impact Factor: 2.8)
H. D. Sehgal, Yogesh Pratap, M. Gupta and S. Kabra "Performance Analysis and Optimization of Under-gate Dielectric Modulated Junctionless FinFET biosensor” IEEE Sensors Journal, Volume: 21, Issue: 17, Sept.1, 1 2021. (Impact Factor: 4.3)
H. D. Sehgal, Yogesh Pratap, and S. Kabra "Detection of breast cancer cell-MDAMB-231 by measuring conductivity of Schottky Source/Drain GaN FinFET” IEEE Sensors Journal, 2022. (Impact Factor: 4.3)
Praveen Pal, Yogesh Pratap, Mridula Gupta, and Sneha Kabra. “T-ZnO/AlGaN/GaN HEMT Uric Acid Sensor-Sensitivity Analysis and Effect of Surface Wettability for Improved Performance." IEEE Sensors Journal, 2022. (Impact Factor: 4.3)
Praveen Pal, Yogesh Pratap, and Sneha Kabra "Small-Signal Analysis of Double-Channel AlGaN/GaN HEMT and MOSHEMT with Undoped Barrier for Microwave Applications, Journal of Electronic Materials, 1-9, 5, 2022.(Impact Factor: 2.1)
N. Garg, Yogesh Pratap, and S. Kabra, “Efficient implementation of a DSIG-JLT-based multiplexer and demultiplexer using different logic styles at 20-nm technolog,” Journal of Computational Electronics, Springer, 2023. (Impact Factor: 2.1)
H. D. Sehgal, Yogesh Pratap, and Sneha Kabra, “Designing and Reliability analysis of radiation hardened Stacked gate Junctionless FinFET and CMOS Inverter” IEEE Transactions on Device and Materials Reliability.2023, (Impact Factor: 2.0)
Publications in International Conferences :
“A single chip implementation of simplified data encryption standard (DES) algorithm,” Yogesh Pratap, R. K. Tripathi, and R. Sharma, ICMARS, December 2011, Jodhpur. India.
“32-bit modulus based barrel sifter for RC6 algorithm,” Manoj Kumar and Yogesh Pratap, ICMARS, December-2011, Jodhpur. India
Analytical Analog/RF Performance of Gate Material Engineering Cylindrical/Surrounding Gate (CGT/SGT) MOSFETs,” Yogesh Pratap, J.H.K Verma, S. Haldar, R. S. Gupta and Mridula Gupta, ICMARS, 13th-15th December-2012, Jodhpur. India.
“Analytical Effect of ITC on the Characteristics of Junctionless Nanowire Transistor (JLNWT) for Future ULSI Applications: Semi-analytical Modeling Approach,” Yogesh Pratap, S. Haldar, R. S. Gupta and Mridula Gupta, INDICON, 13th-15th December-2013, IIT Bombay, India.
“Analytical Capacitance Modeling and Simulation of Dual material-Graded channel - Gate stack Cylindrical/Surrounding (DMGCGS CGT/SGT) MOSFET,” J.H. K Verma, Yogesh Pratap, S. Haldar, R. S. Gupta and Mridula Gupta, International Semiconductor Device Research Symposium (ISDRS), 11th-13th December-2013, Maryland, USA.
“Hot Carrier Reliability Issues of Junctionless Transistor due to Interface Trap Charges for Analog /RF Applications,” Yogesh Pratap, S. Haldar, R. S. Gupta and Mridula Gupta, International Workshop on Physics of Semiconductor Device (IWPSD), 10th13th December-2013, Noida, India.
“Scattering parameter based simulation of cylindrical double gate (CDG) MOSFET forSubmillimeter-Wave Application,” J.H.K Verma, Yogesh Pratap, S. Haldar, R. S. Gupta and Mridula Gupta, ICMARS, 11th-15th December-2013, Jodhpur. India.
“Linearity Performance Investigation of high-k Spacer based Junctionless Nanowire Transistor (JLNWT) for RFIC Design,” Yogesh Pratap, S. Haldar, R. S. Gupta and Mridula Gupta, International Semiconductor Device Research Symposium (ISDRS), 11th-13th December-2013, Maryland, USA.
“RF Performance Analysis and Small Signal Parameter Extraction of CylindricalSurrounding Double Gate MOSFETs for Sub-millimeter Wave Applications,” J. H. K Verma, Yogesh Pratap, S. Haldar,R. S. Gupta and Mridula Gupta, ICDCS, 6th-8th March-2014, Coimbatore, India.
“Damage Immune III-V Compound Material based Vacuum Junctionless Nanowire Transistor (VAC-JNT) for Improved Electrostatic Control and Hot Carrier Reliability,” Yogesh Pratap, S. Haldar, R. S. Gupta and Mridula Gupta, 3rd International Conference onNanotechnology (NANOCON04), 14th-15th October-2014, Pune, India.
“Impact of asymmetric gate stack on a junctionless CSG MOSFET for enhanced hot carrier reliability,” Aniruddh Sharma, Arushi Jain, Yogesh Pratap, and R. S. Gupta, Annual IEEE India Conference (INDICON), 17th-19th December-2015, New Delhi.
CSDG MOSFET: An Advanced novel architecture for CMOS technology,” J.H.K Verma, Yogesh Pratap, S. Haldar, R. S. Gupta and Mridula Gupta, Annual IEEE India Conference (INDICON), 17th-19th December-2015, New Delhi.
“DMG Insulated Shallow Extension Cylindrical GAA Schottky Barrier MOSFET for Removal of Ambipolarity: A Novel Approach,” Manoj Kumar, Yogesh Pratap, S. Haldar, R. S. Gupta and Mridula Gupta, 7th IEEE International Nanoelectronics Conference (IEEE-INEC), 9th-11th May-2016, Chengdu, China.
“Sensitivity Investigation of Gate-All-Around Junctionless Transistor for Hydrogen Gas Detection,” Yogesh Pratap, Manoj Kumar, S. Haldar, S. S. Deswal, R. S. Gupta and Mridula Gupta, 7th IEEE International Nanoelectronics Conference (IEEE-INEC), 9th-11th May-2016, Chengdu, China.
A review on the Eye Stick: Boon to Visually Impaired, Anushka Singh, Deeksha Agarwal, Pratibha Sangam, Prerna Singh, Shivani Ranjan, Yogesh Pratap, Sneha Kabra International Conference on Advances in Nanomaterials and Nanotechnology (ICAN 2016) 4th amd 5th November 2016, Centre for NanoScience and Nanotechnology, Jamia MIlia Islamia. ISBN:978-93-85000-94-2
Yogesh Pratap, Reshma Sinha, Praveen Pal, Sarul Malik and Sneha Kabra “Performance analysis of metalloid source/ drain GaAs-finfet for analog/RF applications”, IEEE 4th International Conference on circuits, devices and systems organised by Karunya University, Coimbatore from 16-17 March 2018. Pp. 219-222, ISBN: 978-1-5386-3476-9/18
Neha Garg, Yogesh Pratap , Mridula Gupta and Sneha Kabra, “Analysis of Interface Trap Charges of Double gate Junctionless Nanowire Transistor (DG-JNT) for Digital Circuit Applications" , IEEE Electron Device Kolkata Conference (2018 IEEE EDKCON)”, November 24-25, 2018, Kolkata organized by IEEE EDS Kolkata Chapter.
17. Himani Dua, Yogesh Pratap, Mridula Gupta and Sneha Kabra, “Impact of different Cavity Structures on Bio-Sensing Response of Junctionless FinFET” Poster presentation in 4th International Conference on Emerging Electronics, December 17th - 19th 2018, Bangalore.
18. Praveen Pal, Yogesh Pratap, Mridula Gupta and Sneha Kabra "Comparative analysis of oxides to improve performance of DC-MOS-HEMTs” IEEE International Conference on Modeling of System Circuits and Devices (MOS-AK India 2019), organised by IEEE Hyderabad Section from February 25th to 27th 2019, IIT - Hyderabad.
Himani Dua, Yogesh Pratap, Mridula Gupta, Sneha Kabra, “Comparative Analysis of Dielectric Modulated Junctionless FinFET Biosensor and Junctionless DG MOSFET Biosensor for Medical Instrumentation” International Conference on Power Electronics, Control & Automation (ICPECA 2019),16-17 November 2019, Jamia Millia Islamia, Delhi
Praveen Pal, Yogesh Pratap, Mridula Gupta and Sneha Kabra Performance of AlGaN/GaN based Common Drain Dual HEMT (CDD-HEMT) for high power applications, 7th IEEE MTT-S International Microwave & RF Conference (IMaRC2019), held at IIT Mumbai, India, December 13-15 2019
Neha Garg, Yogesh Pratap, Mridula Gupta and Sneha Kabra , “Impact of Trap Charges and High Temperature on Reliability of GaAs/Al2O3 based JunctionlessFinFET” 7th International Conference on Computers and Devices for Communication, CODEC 2019, 19th-20th December 2019 at Kolkata.
Himani Dua, Yogesh Pratap, Prof. Mridula Gupta and Sneha Kabra “Comparative Analysis of Junctionless FinFET and Inverted Mode FinFET as Phosphine (PH3) Gas Sensor”, in International Conference on Device, Circuits & Systems (ICDCS), Karunya Institute, Coimbatore, 5th -6th March 2020.
Praveen Pal, Yogesh Pratap, Mridula Gupta and Sneha Kabra “Performance analysis of ScAlN/GaN High Electron Mobility Transistor (HEMT) for biosensing application.” 5th International Conference on Devices, Circuits and Systems (ICDCS’20), at Karunya University, Coimbatore from 5th to 6th March 2020.
Himani Dua Sehgal, Yogesh Pratap, Sneha Kabr, Detection of poisonous gases using JL FinFET with conducting gate polymer, pp-440-444, 6th International Conference on Devices, Circuits and Systems (ICDCS), 2022.
D. Babbar, Yogesh Pratap, Sneha Kabr, Design and Simulation of Double gate Junctionless Field Effect Transistor for Ammonia Gas Sensing, pp-391-396, IEEE International Conference of Electron Devices Society Kolkata Chapter (EDKCON), 2022.
Neha Garg, Yogesh Pratap, and Sneha Kabra, “Impact of Load Capacitance and Interface Trap Charges On Dynamic Behaviour of Double-Gate Junctionless Transistor Based CMOS Inverter” IEEE 9th Uttar Pradesh Section International Conference on Electrical, Electronics and Computer Engineering (UPCON), 2022.
Himani Dua Sehgal, Yogesh Pratap, Sneha Kabr, comparative study of Junctionless and Inverted Mode FinFET for detection of breast cancer cell HS578t at microwave frequency, pp-1-5, IEEE 3rd International Conference on VLSI Systems, Architecture, Technology and Applications (VLSI SATA), 2022.
Shweta Gupta, Yogesh Pratap, Mridula Gupta, "Reliability Assessment of JLFinFET Based Biosensor for Neutral Biomolecule Detection Under Temperature Variation from 250K to 350K" 1st International Conference on Circuits, Power and Intelligent Systems (CCPIS), 2023.