CS6330: Digital Systems Testing and Testable design

Course Instructors

Course Introduction

This course introduces the principles and practices involved in testing modern digital systems and designing them for high testability. The course covers fault modeling, simulation, automatic test pattern generation, and diagnosis of digital circuits, along with design-for-testability (DFT) techniques such as scan chain design. Understanding how testing is integrated into the VLSI design flow to improve reliability, reduce manufacturing defects, and ensure efficient validation of complex digital systems.

Reference Book

M. Abramovici, M. A. Breuer, and A. D. Friedman, Digital Systems Testing and Testable Design. New York, NY, USA: Computer Science Press, 1990.