Publications

Submitted/Under review:
[J4] K. Mazumdar, X. Guo, R. Zhang, M. Stan, "Charge-Recycled Power-Regulation with Stacked Loads and Stacked Switched-Capacitors," Under review for IEEE Design and Test of Computers (D&T).

2018:
PhD Dissertation:
[D] X. Guo, "Towards Wearout-Aware and Accelerated Self-Healing Digital Systems", University of Virginia Library, March 2018. (link) (slides)

Journal Papers:

Conference Papers:
[C17] X. Guo, V. Verma, P. Guerrero and M. Stan, "When "things" get older - Exploring Circuit Aging in IoT Applications", International Symposium on Quality Electronic Design (ISQED), Santa Clara, CA, March 2018. (pdf) (link)

[C16] D. Kamakshi, X. Guo, H. Patel, M. Stan and B. Calhoun, "A Post-Silicon Hold Time Closure Technique using Data-Path Tunable-Buffers for Variation-Tolerance in Sub-threshold Designs", International Symposium on Quality Electronic Design (ISQED)Santa Clara, CA, March 2018. (pdf) (link)

2017:
Patent:
[PA1] M. El-Hadedy, X. Guo, M. Stan, M. Margala, K. Skadron, "Dual-Data Rate Transpose-Memory Architecture." Pending.

Journal Papers:
[J3] X. Guo, V. Verma, P. Guerrero, S. Mosanu, M. Stan, "Back to the Future: Digital Circuit Design in the FinFET Era,"  Journal of Low Power Electronics (JOLPE), Vol. 13, No. 3, pp. 338–355, DOI 10.1166/jolpe.2017.1489September 2017. (Invited Paper) (pdf) ((Invited Talk video)

Conference Papers:
[C15] M. El-Hadedy, X. Guo, X. Huang, M. Margala, "RE-HASE: Regular-Expressions Hardware Synthesis Engine," Third International Workshop on Heterogeneous High-performance Reconfigurable Computing (H2RC'17), in conjunction with SC, Denver, CO, November 2017. (pdf) (slides)

[C14] S. Eldridge, K. Swaminathan, N. Chandramoorty, A. Buyuktosunoglu, A. Roelke, X. Guo, V. Verma, R. Joshi, M. Stan, P. Bose, “A low voltage RISC-V heterogeneous system: boosted SRAMs, machine learning and fault injection on VELOUR," Workshop on Computer Architecture Research with RISC-V (CARRV), co-located with IEEE MICRO, Boston, MA, October 2017. (pdf)

[C13] X. Guo, M. Stan, "Deep Healing: Ease the BTI and EM Wearout Crisis by Activating Recovery," SRC TECHCONAustin, TX, September 2017. (Best in Session Award)

[C12] M. El-Hadedy, X. Guo M. Stan, K. Skadron, W. Hwu, "R-NNPE: Reconfigurable Neural Network Processing Elements," SRC TECHCONAustin, TX, September 2017.

[C11] M. El-Hadedy, X. GuoW. Hwu, M. Stan, K. Skadron, "Crypt-Pi: A Light and Fast Crypto-Processor for IoT Applications," SRC TECHCONAustin, TX, September 2017. (Best in Session Award)

[C10] X. Guo, M. Stan, "Deep Healing: Ease the BTI and EM Wearout Crisis by Activating Recovery," Proc. of  IEEE/IFIP International Conference on Dependable Systems and Networks (DSN) Workshop, Denver, CO, June 2017(pdf) (slides)

[C9] M. El-Hadedy, X. Guo, M. Stan, K. Skadron, "PPE-ARX: Area- and Power-Efficient VLIW Programmable Processing Element for IoT Crypto-Systems,"  Proc. of  NASA/ESA Conference on Adaptive Hardware and Systems (AHS), Pasadena, CA, July 2017. (pdf)

[C8] X. Guo, M. Stan, "Deep Healing: Ease the BTI and EM Wearout Crisis by Activating Recovery," Proc. of 13th IEEE Workshop on Silicon Errors in Logic–System Effects (SELSE-13), Boston, MA, March 2017. (Best Paper Award) (pdf) (slides) (poster)

Posters:
[P11] D. Akella, X. Guo, M. Stan, B. H. Calhoun, "Enabling Post-Silicon Hold Time Closure by Tunable-Buffer Insertion," Design Automation Conference (DAC), Work-in-Progress (WIP) Poster Session, Austin, TX, June 2017.

[P10] X. Guo, M. Stan, "Exploring Aging Issues in Low-Power Internet of Things (IoT) Applications,the 13th Annual University of Virginia Engineering Research Symposium (UVERS), Charlottesville, VA, March 2017. (Acceptance Rate: 25/85 = 29.4%) (pdf)

2016:
Journal Papers:
[J2] X. Guo, M. Stan, "Implications of Accelerated Self-Healing as a Key Design Knob for Cross-Layer Resilience", INTEGRATION, the VLSI journal (VLSI), DOI 10.1016/j.vlsi.2016.10.008, vol. 56, pp. 167-180, 2017(pdf)

[J1] M. El-Hadedy, X. Guo, M. Margala, M. Stan, K. Skadron, "Dual-Data Rate Transpose-Memory Architecture Improves the Performance, Power and Area of Signal-Processing Systems." Journal of Signal Processing Systems (JSPS), DOI 10.1007/s11265-016-1199-1, (2016): 1-18. (pdf)

Conference Papers:
[C7] X. Guo, M. Stan, "Enabling Wearout-Immune BEOL and FEOL with Active Rejuvenation,Proc. of the IEEE/ACM Workshop on Variability Modeling and Characterization (VMC)in conjunction with ICCADAustin, TX, November 2016. (pdf) (poster) (link)

[C6] X. Guo, M. Stan, "Towards Wearout-Free Systems: A Self-Healing Strategy Enabled by Accelerated and Active Recovery,SRC TECHCONAustin, TX, September 2016. (pdf) (slides) (poster)

[C5] M. El-Hadedy, X. Guo, M. Stan, K. Skadron, "Area-Efficient VLIW-based Programmable Processing Element for Crypto-Systems,SRC TECHCONAustin, TX, September 2016. (pdf) (slides(poster)

[C4] X. Guo, M. Stan, "Work hard, sleep well - Avoid irreversible IC wearout with proactive rejuvenation,Proc. of the ACM/IEEE Asia and South Pacific Design Automation Conference (ASP-DAC), Macau, China, January 2016(Acceptance Rate: 94/274 = 34.3%) (pdf) (slides)

Posters:
[P9] X. Guo, M. Stan, "Towards Wearout-aware and Accelerated Self-healing Digital Systems," ACM Student Research Competition (SRC)IEEE/ACM International Conference on Computer-Aided Design (ICCAD)Austin, TX, November 2016.  (poster)

[P8] X. Guo, M. Stan, "CLASH - Cross-Layer Accelerated Self-Healing: Circadian Rhythms for Resilient Electronic Systems," SRC System Level Design (SLD)  ReviewHillsboro, OR, April 2016. (poster)

[P7] X. Guo, M. Stan, "Towards Wearout-aware and Accelerated Self-healing Digital Systems," SIGDA Student Research Forum (SRF)Asia and South PacifiDesign Automation Conference (ASP-DAC)Macau, China, January 2016. (link) (abstract) (poster)

2015:
Conference Papers:
[C3] X. Guo, M. Stan, "MCPENS: Multiple-Critical-Path Embeddable NBTI Sensors for Dynamic Wearout Management," Proc. of 11th IEEE Workshop on Silicon Errors in Logic–System Effects (SELSE-11), pp. 116-121, Austin, TX, April 2015. (pdf) (slides

Posters:
[P6] A. Roelke, X. Guo, M. Stan, "Architecture Implications of Proactive Accelerated Wearout and Recovery," Center for Future Architecture (C-FAR) Annual Review Poster PitchesAnn Arbor, MI, November 2015. (pdf)

[P5] X. Guo, M. Stan, "Towards Wearout-aware and Accelerated Self-healing Digital Systems," In SIGDA PhD ForumDesign Automation Conference (DAC)San Francisco, CA, June 2015. (link) (abstract) (poster)

[P4] X. Guo, M. Stan, "Towards Aging-aware and Self-healing VLSI Chips and Systems,the 11th Annual University of Virginia Engineering Research Symposium (UVERS), Charlottesville, VA, March 2015. (pdf)

[P3] M. Stan,  X. Guo, A. Roelke, "Modeling and Experimental Demonstration of Accelerated Self-Healing Techniques in CMOS Circuits," Proc. of the Government Microcircuit Applications & Critical Technology Conference (GOMAC Tech), St. Louis, MO, March 2015. (pdf

2014:
Conference Papers:
[C2] X. Guo, W. Burleson, M. Stan, "Modeling and Experimental Demonstration of Accelerated Self-Healing Techniques," In Proc. of ACM/IEEE Design Automation Conference (DAC), San Francisco, CA, June 2014. (Acceptance Rate: 174/787 = 22%) (pdf) (.ppt) (poster)

[C1] Y. Zhao, Y. Yang, K. Mazumdar, X. Guo, M.R. Stan, "A Multi-Output on-Chip Switched-Capacitor DC-DC Converter for Near- and Subthreshold Power Modes," In Proc. of IEEE International Symposium on Circuits and Systems (ISCAS), Melbourne, Australia, June 2014. (pdf) (.ppt)

Posters:
[P2] X. Guo, M. Stan, "Exploring Accelerated Self-Healing Techniques for Electronic Chips and Systems," the 10th Annual University of Virginia Engineering Research Symposium (UVERS), Charlottesville, VA, March 2014.(pdf)

2013:
Posters:
[P1] X. Guo and M. Stan, "Aging effect in FPGA chips and systems," A. Richard Newton Young Fellow Poster Session, Design Automation Conference (DAC), Austin, TX, June 2013. (pdf)

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