Synthesis Instruments:
DC sputtering System
RF Sputtering System
DC PECVD System
Dip Coating System
LB Synthesis Unit
Vaccum Evaporation Unit
Computational Facilities:
CASTEP (CAmbridge Serial Total Energy Package)
Characterization Instruments:
X-Ray Diffractometer
Atomic Force Microscope
Field Emission Scanning Electron Microscope with EDX and CL attachment
High Resolution Transmission Electron Microscope with SAED attachment
Spectroscopic Ellipsometer
Fourier Transform Infrared Spectroscope
UV-Visible-NIRÂ Spectrophotometer
X-Ray Photoelectron Spectrophotometer
Low Temperature Electrical Measurement System
Low Temperature Photoluminescence Spectrophotometer
Fluorometer
LCR Meter