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1. Next-Generation Semiconductor Devices and Thin Films
Structure Analysis of Semiconductor Thin Films: HfO2, HZO, IGZO, SiON, MoS2, h-BN, and etc.
Performance Optimization of Ferroelectric RAM (Fe-RAM)
Development of New Analytical Techniques
2. Revolutionary EUV Photoresist Technology Development
Development novel EUV photoresists & mechanisms for improved performance and purity
Development of EUV interference lithography
EUV PR pattern characterization via CD-SAXS techniques
Enhancing resolution, LER/LWR, and sensitivity
Process Integration and Manufacturability Considerations
3. Advanced Energy Materials and Devices for a Sustainable Future
Structural characterization of halide Perovskite materials
in-situ characterization of perovskite structure evolution
Enhancing operational longevity and stability, large-area modules with high efficiency and uniformity
Characterization of Li-/Na-ion Secondary Batteries, all solid electrolyte batteries, and Fuel cells
in-situ characterization during charging-discharging cycling
High-pressure X-ray diffraction & XAFS studies
Rietveld structure analysis: Structure-Property Relationship
4. Synchrotron Beamline : 6D UNIST-PAL Beamline with Multi-experimental stations
Mastering Advanced Materials Characterization: Become an expert in leveraging synchrotron radiation facilities to unlock material secrets at an atomic level.
Utilizing State-of-the-Art Instrumentation & Designing Novel Experimental Setups: Engage in in-situ and operando studies using cutting-edge beamline instrumentation. Contribute to the development and design of innovative experimental configurations.
Developing Advanced Data Analysis: Create and apply cutting-edge data analysis techniques, including AI-aided approaches for complex data interpretation.
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