Research
Research Interests:
Experiments with Transmission electron microscopy.
In-situ Electron Microscopy study.
Growth and characterization of thin films.
Electron and Ion beam lithography.
Thin films
Nanomaterials
Current Project:
Microstructural characterization of steels for Advanced Ultra Super critical (AUSC) Applications.
Growth and Characterization of GaN on Si.
Developing new buffer layers on Si for GaN growth.
Growth and optimization of SiC on Si in MBE.
Experimetnal Techniques:
High resolution (Scanning) Transmission Electron Microscopy (JEOL 2010, FEI Talos, JEOL ARM 200 C with Cs corrector) with hot and cold-stage holder.
Extensive experience in planar and cross-sectional TEM sample preparation using mechanical polishing (Southbay), Dimpling (Gatan) and Ion milling (Gatan and Technoorg) and also with FIB (VERSA).
Extensive experience in scanning electron microscopy (Zeiss Neon 40) and Focused Ion Bem.
X-ray diffraction methods.
Thin Film depositions by Thermal vapor deposition and Chemical vapor deposition Methods
Familiar with Rutherford Backscattering Spectrometry
Familiar with Photoluminescence, Raman Spectroscopy, XPS, SIMS and AFM.