Research

Research Interests:

  • Experiments with Transmission electron microscopy.

  • In-situ Electron Microscopy study.

  • Growth and characterization of thin films.

  • Electron and Ion beam lithography.

  • Thin films

  • Nanomaterials

Current Project:

Microstructural characterization of steels for Advanced Ultra Super critical (AUSC) Applications.

    • Growth and Characterization of GaN on Si.

    • Developing new buffer layers on Si for GaN growth.

    • Growth and optimization of SiC on Si in MBE.

Experimetnal Techniques:

  • High resolution (Scanning) Transmission Electron Microscopy (JEOL 2010, FEI Talos, JEOL ARM 200 C with Cs corrector) with hot and cold-stage holder.

  • Extensive experience in planar and cross-sectional TEM sample preparation using mechanical polishing (Southbay), Dimpling (Gatan) and Ion milling (Gatan and Technoorg) and also with FIB (VERSA).

  • Extensive experience in scanning electron microscopy (Zeiss Neon 40) and Focused Ion Bem.

  • X-ray diffraction methods.

    • Thin Film depositions by Thermal vapor deposition and Chemical vapor deposition Methods

  • Familiar with Rutherford Backscattering Spectrometry

  • Familiar with Photoluminescence, Raman Spectroscopy, XPS, SIMS and AFM.