Physicist
SK Hynix
NAND Product Engineering
2091, Gyeongchung-daero, Bubal-eup, Icheon-si, Gyeonggi-do, 17336, Republic of Korea,
E-mail : kom7807@gmail.com ;
CAREER
Oct. 2014 - Present :
Technical Leader,
NAND Product Engineering,
Icheon, Republic of Korea
Mar. 2013-Sept. 2014
Research Assistant Professor (Research Fellowship),
Department of Physics, Hanyang University
Seoul, Republic of Korea
Jan. 2014
Visiting Researcher
NEC, Research & Development Tsukuba Research Lab. JAPAN
Mar. 2013-Jun. 2013
Part-Time Lecture
Department of Electronics Material Engineering,
Seoul, Republic of Korea
Sept. 2011-Feb. 2013
Research Assistant Professor,
Research Institute for Natural Science, Hanyang University
Seoul, Republic of Korea.
Sept. 2010-Aug. 2011
Postdoctoral Fellow,
Department of Physics, Hanyang University
Seoul, Republic of Korea
Mar. 2010-Aug. 2010
Part-Time Lecture
Department of Electronics Material Engineering,
Seoul, Republic of Korea
Mar. 2010-Aug. 2011
Postdoctoral Fellow,
Research Institute for Natural Science, Hanyang University
Seoul, Republic of Korea.
Jan. 2000 - Mar. 2002 (Full -Time Military Service)
Sergeant ,
(Rifleman & Ammunition specialist )
EDUCATION
Mar. 2005–Feb. 2010 :
Seoul, Republic of Korea
Majored in Semiconductor Physics, Ph. D
Thesis : Study on electron charging effect of quantum well of nano-particles for application of electrical device
Advisor : Prof. Eun Kyu, Kim
Mar. 1997 –Feb. 2005 :
Seoul, Republic of Korea ,
Majored in Physics, B. S
Mar. 1994 –Feb. 1997 :
RESEARCH INTERESTS
- New functional hybrid memory device consisting of quantum dot and 2-D material
- Non-Volatile Memory device, Resistive switching nonvolatile memory device
- Physical modeling of electron transport behaviors
- Organic-inorganic hybrid quantum-dots memory device
- Effect of high energy particle irradiation on semiconductor
- High-efficiency quantum-dot solar cell
- Intermediate band solar cell, 3rd generation quantum dots solar cells
- Deep Level Transient Spectroscopy (DLTS)
RESEARCH SKILL
- Deep Level Transient Spectroscopy (DLTS) Measurement.
- Sputter, Ultra-High Vacuum Sputter, e-beam/thermal Evaporator. Rapid Thermal Annealing and Furnace.
- Atomic Force Microscopy, UV-Vis Spectroscopy, Solar Simulator, and Photoluminescence.
- Fabrication process for semiconductor devices such as MOSFET, FET, Diode and TFT.
- Formation of metal oxide, metal and semiconductor quantum dots by using chemical synthesis and physical deposition process
- Electrical characterization of semiconductor device such as MOSFET, FET, Diode and TFT.
( HP4280A 1-MHz capacitance-voltage meter, HP4156a Precision Semiconductor Parameter Analyzer, an Agilent E4980A precision LCR meter, Keithley 2400 source meter, Keithley 6485 picoammeter, and a Keithley 6430 Sub-Femtoamp Remote SourceMeter et. al)
- Software : OriginPro, Word, Excel, Powerpoint, Labview (basic)