New Paper in Sci. Rep.

Post date: Aug 31, 2016 3:08:40 PM

New paper has been published from Scientific Reports.

T. Matsumoto, N. Yoshida, S. Nishio, M. Hoga, Y. Ohyagi, N. Tate, and M. Naruse: Optical nano artifact metrics using silicon random nanostructures, SCIENTIFIC REPORTS, Vol. 6, Article No. 32438, August 2016. [doi]