NEXT-TIP S.L.

Based on a patented technology of which I am co-inventor (Patent P201030712: “Modification of Atomic Force Microscopy Tips by Deposition of Nanoparticles with an Aggregate Source”. 2010. Holder entity: CSIC), in October 2012 I co-founded Next-Tip S.L., a spin-off of the CSIC devoted to the fabrication of high added value Scanning Probe Microscopy (SPM) tips, specially designed for high resolution in dynamic modes. The technology is based on a new method to functionalize and modify the final tip radius by nanoparticles of controlled size (typically 2-3 nm) and composition (usually Au) on the Atomic Force Microscopy (AFM) tips. This coating provides a great sensitivity, stability, high spatial resolution, and longer life time than conventional tips. Details of the process are described in the article: Aspect-ratio and lateral-resolution enhancement in force microscopy by attaching nanoclusters generated by an ion cluster source at the end of a silicon tip , L. Martínez et al., Review of Scientific Instruments, 82 (2011) 023710.

Between 2013 and 2015, through a Torres Quevedo contract, I have been responsible of the Next-Tip Research & Development department. During this period I have been in charge of the development of two new products: high sensitivity tips for Kelvin Probe Microscopy (KPFM) and probes for Tip-enhanced Raman Spectroscopy (TERS). This last one is of special relevance as TERS is a technique with a great potential waiting for high quality probes. The proof of concept is described in the following article: Nanoscale Chemical Imaging of Bacillus subtilis Spores by Combining Tip-Enhanced Raman Scattering and Advanced Statistical Tools, G. Rusciano et al., ACS Nano, 8 (2014) 12300. Apart from this, I am working in new developments of probes for other SPM modes, such as Magnetic Force Microscopy (MFM).