Equipments

Lab Equipments

1. Scanning Electron Microscopy (up to x100,000)

2. 4-Probe Mapping Station (Sheet resistance / Resistivity / Conductivity)

3. UV-Vis Spectroscopy (200 ~ 1,100 nm, Automatic x8 cells, Film)

4. FT-IR Spectroscopy (Normal / ATR / Grazing-angle)

5. Ultracentrifuge (up to 13,000 rpm)

6. Parameter Analyzer (FET characterization)

7. Tip-Sonicator with 24 small tips (up to 24 vials)

8. Multi-Dip Coater (up to 3 different solutions)

9. Freeze Dryer (-50 oC)

10. Graphene CVD Growth Chamber (up to 1,000 oC)

11. Schrenk Line (N2 & Vacuum)

12. Zeta-Potential

13. Bar Coater (Semi-automatic)

14. Spin Coater (Teflon inbody)

15. CO2 Sensor (up to 2,000 ppm)

16. Controlled UV Irradiation Box (254 nm / 365 nm)

17. Multimedia Optical Microscopy (Zoom lens up to 20 um)

18. Furnace (Air / N2 / Ar / H2 / Vacuum)

19. Paste Mixer (up to 500 rpm)

20. Roll Mill (up to xxx rpm)

Department Equipments

1. Fluorescence Spectroscopy (also in Lab of Prof. Sung Young Park)

2. Gel-Permeation Chromatography (THF : Our department / DMF : Lab of Prof. Sung Young Park)

3. Contact Angle Measurement (also in Lab of Prof. Sung Young Park)

4. Dynamic Light Scattering

5. Glove Box

6. Hot Pressure

7. UZ-Ozone System

8. Clean Bench

9. Rheometer

10. TGA

11. DSC

12. Microscopy

13. Electrospinning

14. Tensile Strength

15. Impact Strength

16. Electrospinning

17. Extruder

University Equipments

1. Atomic Force Spectroscopy (AFM)

2. Field Effect Scanning Electron Microscopy (FE-SEM)

: JSM-7610F (JEOL)

3. Energy Dissipate X-ray Spectroscopy (EDX)

5. Inductively-Coupled Plasma Mass (ICP-Mass)

: OPTIMA 2000DV (PerkinElmer)

6. Gas Chromatography Mass (GC-Mass)

: HP 6890 (HP)

7. Ion Chromatography

: ICS-3000 (Dionix)

7. X-ray Diffractometer (XRD)

8. Confocal Laser Scanning Microscope

: LSM 510 (ZEISS)

9. Raman Spectrometer

: NRS-3200 (Jasco)

10. UV/VIS/NIR Microspectrometer

: QDI 1000 (CRAIC)

11. Ion Slicer (TEM Sampling)

: EM-091001S (JEOL)

12. Cross Section Polisher (SEM Sampling)

: IB-19510CP (JEOL)

13. Surface Profiler

: ET-3000i

14. Electron Probe Micro Analyzer (EDX Mapping)

: EPMA-1600

15. Thermal Analysis System (Thermal Conductivity)

: TC-7000 (ULVAC)

16. Carbon/Sulfur Determinator

: CS-200

17. Brunauer–Emmett–Teller (BET)

18. Nuclear Magnetic Resonance Spectroscopy (1H or 13C NMR)

Outside Equipments

1. Transmission Electron Microscopy (TEM) - KAIST

2. High Resolution Transmission Electron Microscopy (HR-TEM) - KAIST

3. X-Ray Photoelectron Microscopy (XPS) - KAIST

4. Raman Spectroscopy - KAIST

5. Fluorescence Decay Time Measurement - KAIST

6. Selected Area Electron Diffraction (SAED) - KAIST