Reviewer
IEEE SPL, IEEE JBHI, IEEE TDSC, IEEE TII, IEEE IoT, IEEE TMSC, IEEE Access, IEEE TIFS, IEEE TETC,IEEE JSAC, IEEE OJCS, IEEE TCE, IEEE TNSE, IEEE TC, IEEE TSC, IEEE TVT, IEEE TIE, IEEE TVLSI, IEEE CL, IEEE Systems Journal, IEEE Net. Mag. IEEE Com. Mag., IEEE CE Mag., IEEE IoT Mag., .
ACM TDAES, ACM TMIS, ACM TECS, ACM TOMM.
IET IP, IET Net., IET CDT, IET IS, IET WSS, IET Com, IET Biom, IET SP, IET Blockchain,.
Springer: JCC, MTA, FITEE, JoMS, AT, SC, WPC, AI, MNA, AJSE, SCIENCE CHINA IS, SNCS.
Elsevier: VECom, SCSI, CoM Com, JSA, CN, CSI, CMPB, MCM, CAEE, Info Sc, DCE, JISA, FGCS, JNCA, ComSec, OQE, .
6. Wiley: CCPE, SCN, SPY, IJCS, TETT.
7. Taylor & Francis: IJCM, Con Sc.
8. MPDI: Sensors, .
9. JIT (Taiwan), ETRA (Korea), China Com (China).