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MAIN ADVANCED EQUIPMENT
I²TEM : Interferometry & In situ Transmission Electron Microscope -
Specially designed HF3300 (from Hitachi High Technology)
Specific Sample Holders for in-situ experiments, High resolution CCD
Camera and Energy Spectrometer have been funded by the MIMETIS project
I2TEM is a 300 kV cold FEG microscope specially designed to perform Electron Holography and in-situ experiments. It is equipped with a spherical aberration corrector ("Aplanator" B-corr from CEOS) and with the latest generation of energy filter GIF Quantum ER-965. Four rotatable electrostatic biprisms allow performing advanced electron holography and interferometry experiments.
A fast OneView 4K x 4K camera (Gatan) for in-situ TEM experiments
Sample holders available:
- Single tilt (Gatan)
- Double tilt (Gatan)
- Tilt - rotation (Gatan)
- Heating - Cooling (-120°C) stage with 4 electric contacts for in-situ biaising (Gatan)
- Nano-indentor (Hysitron)
- Magnetizing stage (Hummingbird)
- Cooled straining stage (Gatan)
Cet equipement a été acquis avec le soutien du Conseil Régional Midi-Pyrénées, des fonds FEDER, du MESR et du CNRS
Helios Dual Beam :
Dual (Ion and Electron) beam - (from FEI Company)
This instrument has been entirely funded by the MIMETIS project
A dual beam microscope is the unavoidable tool for nanomanipulation and imaging at the nanoscale. Its main objective in the project is to produce high quality TEM sample. Nevertheless the combination of image with electrons and milling or deposit with ions render such an instrument a standalone tool for in situ analysis.
Main characteristics of the machine installed in CEMES are :
- 5 GIS (Gas Injection System) : systems of controlled and micro-injection for a local deposition of metals (Tungsten, Platinum, Cobalt) or enhancement of miling (Oxygen, Carbon)
- Omniprobe System : a controllable nanotip for easily manipulating TEM lamellae during their process
- EBSD (Electron Back-Scattered Diffraction)
- EDX (Energy Dispersive X-ray) spectrometer Oxford X-max 150
- Chamber modularity for accepting various platform for further experiments (controled stress application, nanomanipulation)
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OTHER EQUIPMENT
SACTEM:Spherical Aberration Corrected Transmission Electron Microscope Tecnai F20-C (from FEI Company)SACTEM is a 200 kV Schottky FE-TEM used to perform HREM, STEM-EELS, EFTEM and Electron Holography experiments.
It is equipped with one electrostatic Möllensted biprism, a CEOS spherical aberration corrector (C-COR) , a GIF Tridiem from Gatan and a pre-GIF high resolution (2KX2K) camera from Gatan. A Gatan STEM is also dedicated to perform line and image spectrum (STEM-EELS).
Sample holders available:
- Sample holders available:
- Single tilt (FEI)
- Double Tilt (FEI)
- Liquid Nitrogen Cooling holder (Gatan)
- Nano-indentor, STM and Field emission double tilt holder (Nanofactory)
- Tomography holder (Fishione)
- Heating holder (Gatan)
- JEM-2010 : JEM-2010 is a Jeol 200 kV LaB6 TEM used to perform conventional TEM imaging and in-situ experiments using various commercial and home made holders. It is equipped with a high contrast aperture option, and a video camera to record movies of structural events during in situ experiments (straining, cooling, heating, …). Sample holders available:Single tilt (Jeol)
- Double Tilt (Jeol)
- Tilt-Rot (Jeol)
- Traction holder (Gatan)
- Heating holder (Gatan)
CM20FEG :
CM20FEG is a 200 kV Schottky FE-TEM used to perform conventional TEM imaging, STEM-EDX, STEM imaging using BF/DF/SE and dedicated electron diffraction experiments.
It is equipped with a STEM stage, bright field, dark field and secondary electron detectors, a Bruker SDD EDS detector and Nanomegas precession and ASTAR module for orientation mapping. Imaging can be performed using a wide field of view (4K2K) Orius camera from Gatan.
Sample holders available:
- Single tilt (FEI)
- Double Tilt (FEI)
- Low Background (FEI)
- SEM holder for STEM-SE imaging (FEI)
- Heating holder (Gatan)
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