We have various facilities for thin film inspection and also take customized measurement order.

1. Hall Measurement Meter

2. X-Ray Diffractometer

3. Surface Profile Alfa-step

4. VIS-Infrared Spectrometer

5. AFM

6. SEM and EDS

7. FTIR

8. Contact Angle Analyzer

9. Probe Planter (self-developed)

10. High Resistance Meter

11. Probe Inspector (self-developed)

12. Optical Microscope