About
The mission of the Super-Resolution Summit is to advance the field of super-resolution microscopy, provide a platform for knowledge-sharing and collaboration, and help attendees stay up-to-date with the latest innovations and techniques.
Industry Networking
Whether you are a seasoned expert in the field of super-resolution microscopy or a newcomer looking to learn more, the Summit is an excellent opportunity to build your professional network and expand your knowledge.
Super-Resolution Presentations
Presentations will provide attendees with valuable insights into the latest developments in super-resolution microscopy, as well as tips and tricks for optimizing imaging workflows.
Live Product Demonstrations
ONI's product demonstrations will give attendees the opportunity to see the latest microscopy equipment and software in action, and to learn how these tools can be used to advance their own research projects.
Who should attend?
Microscopists seeking to improve their knowledge of super-resolution microscopy
Researchers in life sciences, biophysics, and biotechnology working on nanoscale imaging
Imaging facility managers/staff wanting to add super-resolution microscopy to their services
Early career scientists/graduate students exploring innovative imaging techniques
Industry professionals developing new imaging technologies/products
Computational biologists/image analysts developing new analysis techniques/algorithms
Biomedical engineers/materials scientists designing new imaging probes/technologies
Researchers in cancer biology, neurobiology, cell biology, extracellular vesicles, or assay and probe development
Professionals staying up-to-date with super-resolution microscopy advances and trends
The Venue
A mainstay of the University of North Carolina at Chapel Hill campus for more than 100 years, The Carolina Inn offers refined southern hospitality in a historic setting. Located steps away from the UNC campus, the Inn is near the medical center, football stadium, basketball arena and charming Franklin Street.
