Research Area

Materials characterization techniques, particularly powder X-ray diffraction, scanning electron microscopy, and transmission electron microscopy techniques. Skilled in generating standard operational procedures, sample preparation protocols, and data interpretation.

Extensive knowledge in the area of in‑situ transmission electron microscopy (TEM) provides dynamic observations of the physical behavior of materials in response to external stimuli such as temperature and Aberration corrected transmission electron microscopy (Spherical aberration corrector).

Expertise in fractography analysis of materials using Scanning Electron Microscopy (SEM). 

Extensive knowledge and experience in Powder X‑ray Diffractometer with high‑temperature attachment.