Performing original and intensive researches on simultaneously in situ nanoscale surface characterization of mechanical, electric, chemical, optical intrinsic properties by developing the advanced spectroscopy-combined AFM/STM/SEM.
Domestic and international collaboration for convergent nanoscale science & technology.
Advanced Scanning Electron Microscope (SEM)
Combining AFM+SEM for in situ nanoscale surface characterization.
Surface height information + Lateral image combination.
Visualization of the nanoscale materials along with mechanical properties of the materials.