Debiased incremental learning (DIL): A novel framework for mitigating bias in incremental learning, Shubham Bagwari, Pratik Mazumder, Elesvier Knowledge-Based Systems, 2026
An Edge Filter Based Approach of Neural Style Transfer to the Image Stylization, Shubham Bagwari, Kanika Choudhary, Suresh Raikwar, R Nijhawan, Sunil Kumar, Mohd A. Shah, IEEE Access: Journal, 2022.
Beyond Visual Realism: A Comparative Study of Generative Models for Hindi Handwritten Text Generation, Ratnesh Dubey, Divyaansh Mertia, Shubham Bagwari, Pratik Mazumder, National Conference on Computer Vision, Pattern Recognition, Image Processing and Graphics (NCVPRIPG) 2026.
Learning from the Margins: Intra-Class Graph Structure for Fair Deep Models, Pratik Mazumder, Divyaansh Mertia, Shubham Bagwari, National Conference on Computer Vision, Pattern Recognition, Image Processing and Graphics (NCVPRIPG) 2026.
Hybrid Sensitivity-Aware Filter Pruning for Fair Dermatological Diagnosis, Shivani Tiwari, Divyaansh Mertia, Shubham Bagwari, Pratik Mazumder, National Conference on Computer Vision, Pattern Recognition, Image Processing and Graphics (NCVPRIPG) 2026.
Lightweight Shared Gating for Robust Vision Transformers on Small Datasets, Gourav Sen, Divyaansh Mertia, Shubham Bagwari, Pratik Mazumder, National Conference on Computer Vision, Pattern Recognition, Image Processing and Graphics (NCVPRIPG) 2026.
AuxDenseFeatAlign: Auxiliary Dense Feature Alignment for Medical Incremental Learning, Arnab Roy, Shubham Bagwari, Pratik Mazumder, IEEE Guwahati Subsection Conference (IEEE GCON) 2026
A Review: The study and Analysis of Neural Style Transfer of Image, Shubham Bagwari, Kanika Choudhary, Suresh Raikwar, PS Rana, Sumit Miglani, International Conference on Computer Vision and Machine Intelligence (CVMI), 2022.
Super-Resolution Methods for Images with Text: Concept, Application, and Challenges [Accepted], Kanika Choudhary, Shubham Bagwari, Rajesh Kumar, Ashutosh Mishra, Suresh Raikwar, International Conference on Innovative Researches in Engineering & Technology (IRET), 2022.Â