ANWESHA PATEL
ANWESHA PATEL
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Research Scholar
Research Scholar
School of Electrical and Computer Sciences (SECS)
LAB : Internet of Things (IoT) Lab (303)
Email : a24cs09002@iitbbs.ac.in / anweshapatel.cse@gmail.com
Linkedin profile: www.linkedin.com/in/anwesha-patel
Address : Burla, Odisha, India
Basic Information
Basic Information
PhD (CSE), Pursuing, Indian Institute of Technology (IIT), Bhubaneswar in Computer Science and Engineering.
M.E (CSE), completed in 2023, National Institute of Technical Teachers Training & Research (NITTTR), Chandigarh, in Computer Science and Engineering with CGPA : 9.19/10.
B.Tech (CSE), completed in 2020, Veer Surendra Sai University of Technology (VSSUT), Burla, Odisha, in Computer Science and Engineering with CGPA : 9.50/10.
Higher Secondary (12th), 2016, D.A.V. Public School, MCL, Burla with 92.4%.
Secondary (10th), 2014, D.A.V. Public School, MCL, Burla with 10 CGPA.
Experience
Experience
Mar 6, 2024 to July 7, 2024 - Junior Research Fellow (JRF) Indian Institute of Technology (IIT), Bhubaneswar
Feb 25, 2021 to Sept 30, 2021- Backend Developer, Assistant System Engineer (ASE) Tata Consultancy Services (TCS), Bhubaneswar
May 20, 2018 to July 8, 2018 - Intern at Indian Institute of Technology (IIT), Kharagpur
Dec 21, 2017 to Jan 3, 2018 - Intern at Centre for Development of Advanced Computing (C-DAC), Pune
Honors and awards
Honors and awards
Qualified GATE 2021, Graduate Aptitude Test in Engineering (GATE) is a national examination conducted by Indian Institute of Science (IISc) Bangalore and Indian Institutes of Technology (IITs) on behalf of National Coordination Board (NCB)-GATE, Department of Higher Education, Ministry of Education (MoE), Government of India.
Received scholarship from Ministry of Human Resource Development (MHRD), Govt. of India, from October, 2021 to September, 2023, for pursuing M.E. at National Institute of Technical Teachers Training & Research (NITTTR), Chandigarh.
Publications
Publications
A. Dutta, A. Patel, and R. Mall, “Investigation into the effectiveness of white-box T-way testing,” IET Software, vol. 13, no. 6, pp. 610–616, 2019. [Published] [Science Citation Index Expanded]
Conference and Preprint
Conference and Preprint
A. Patel, R. Chhabra, and C. R. Krishna, “Affective Driver Emotion Analysis in VANETs using Heterogeneous Dataset” in International Conference on Artificial Intelligence, Computing, IoT and Data Analytics (AICTA), 2023. [Presented] [Scopus Indexed]
A. Patel, R. Chhabra, and C. R. Krishna, “Driver Inattentiveness Detection Techniques for Intelligent Transportation Systems: A Review” in 2nd Edition of IEEE Delhi Section Flagship Conference (DELCON), 2023. [Published] [Scopus Indexed]
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