Supervised Ph.D. Students
Suman Kalyan Sardar (co-advisor: Biswajit Sarkar), Integrating Machine Learning, Radio Frequency Identification, and Consignment Policy for Reducing Unreliability in Smart Supply Chain Management, Feb. 2021.
Juho Yoon, Data Mining-Based Industrial Property Analytics Methodologies for Technology Commercialization, Aug. 2024. (Post-DOC, KIST)
Muhammad Zubair Iqbal, A Group Feature Ranking and Selection method for High Dimensional Datasets, Aug. 2024.
Supervised Master Students
김승우, A classification model considering a confidence score of missing value imputation. Aug. 2022. (딜로이트 Korea)
송창용, A multi-class data description based method for classifying predefined defect patterns and detecting undefined defect patterns. Aug. 2022. (삼성전자)
김현서, Prediction of Material Removal Rate and Quantification of Process Sensor Importance in Chemical Mechanical Polishing Using Convolution LSTM. Feb. 2023. (LG 에너지 솔루션)
최이수, Wafer Defect Pattern Clustering Method with Self Supervised Learning Robust to Pattern Imbalance. Feb. 2023. (LG 에너지 솔루션)
박형일, Object Segmentation based Model for Detecting Mixed-Type Defect Patterns in Wafer Bin Maps. Feb. 2023.
이주영, Robust wafer defect pattern classification and new defect pattern detection in imbalanced data using few-shot Learning, Feb. 2024. (LG 에너지 솔루션)
장갑수, Novel Explainable Similarity-Based Potential Customers Recommendation Method for Entering New Markets: Using a Transaction Network, Aug. 2024. (PhD. student in Arizona State University)
황민규, Prediction of material removal rate and process diagnosis method of chemical mechanical polishing process using dual-aspect sensor transformer, Aug. 2024. (삼성전자)
박상민, Robust Health Indicator Development and Attention-based Remaining Useful Life Prediction under Time-varying Operating Conditions, Feb. 2025. (한국전자기술연구원)
김은식, An Improved Generative Model for Missing Sensor Data Imputation, Feb. 2025.
권세훈, Prediction Method of Li-ion Battery State of Health Based on CEEMDAN-Multi encoder Transformer, Aug. 2025.
여이지, RUL Prediction via Domain Adaptation and Transfer Learning across Fault Types in Etching Systems, Aug 2025.