[1] K.-W. Hou and R. C.-T. Lee, "The Efficiency of Discrete Convolution Method on Solving Exact String Matching Problem," in Proc. 29th Workshop on Combinatorial Mathematics and Computation Theory, pp. 217-223, Apr. 2012.
[2] K.-W. Hou and C.-W. Wu, "Fault Models and Test Algorithms for Multi-Level Cell (MLC) Crossbar RRAM," in Proc. VLSI Test Technology Workshop (VTTW), July 2017.
[3] J.-Y. Hu, K.-W. Hou, C.-Y. Lo, Y.-F. Chou and C.-W. Wu, “RRAM-Based Neuromorphic Hardware Reliability Improvement by Self-Healing and Error Correction,” in Proc. IEEE Int. Test Conf. in Asia (ITC-Asia), pp. 19-24, Aug. 2018.
[4] C.-H. Chuang, K.-W. Hou, C.-W. Wu, M. Lee, C.-H. Tsai, H. Chen, and M.-J. Wang, “A Deep Learning-Based Screening Method for Improving the Quality and Reliability of Integrated Passive Devices”, in Proc. IEEE Int. Test Conf. in Asia (ITC-Asia), Sept. 2020 (Best Paper Award).
[5] K.-W. Hou, H.-H. Cheng, C. Tung, C.-W. Wu and J.-M. Lu, "Fault Modeling and Testing of Memristor-Based Spiking Neural Networks", in Proc. IEEE Int. Test Conf. (ITC), pp. 92-99, Sept. 2022.
[6] C. Tung, K.-W. Hou and C.-W. Wu, "A Built-In Self-Calibration Scheme for Memristor-Based Spiking Neural Networks," in Proc. Int. Symp. on VLSI Design, Automation and Test (VLSI-DAT), pp. 1-4, Apr. 2023 (Best Paper Award).
