Urbino University’s Atomic Force Microscope Facility

The Facility

Urbino University has available a scanning probe microscope system for use by the Urbino community. Atomic Force Microscopy (AFM) is a microscopy technique that can measure surface morphology down to atomic resolution. Also nanomechanical properties of samples and single molecule behaviour can be analysed.

Current Capabilities

The facility currently includes a PARK SYSTEMS XE-100 Atomic Force Microscope. It operates in an X-Y closed loop mode. Modalities, in air and in liquid environment, include:

Contact Mode imaging

True non-Contact Mode imaging

Tapping Mode imaging

Phase Imaging

FMM imaging

Nanoindentation

Force Volume Imaging

Quantitative imaging of properties such as Young’s modulus and dissipation

Force-Distance quantitative imaging

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Who can use it?

Members of the Urbino community are encouraged to make use of this versatile resource. In addition, outside entities may use it based on availability.

Contact Information

For further information, contact :

Michele Menotta michele.menottaREMOVE@uniurb.it +39-0722-305232

Mauro Magnani mauro.magnaniREMOVE@uniurb.it