FTXS 2012 - Boston, MA
The 2nd Fault Tolerance for HPC at eXtreme Scale (FTXS) 2012
SUBMISSION DEADLINE EXTENDED: March 24, 2012 - 11:59 PM EST (FINAL DEADLINE EXTENSION!)
Workshop Agenda
Below (slides) and (REFerences) are linked where available.
Submission Essential Information
Submissions are expected in the following categories:
Regular papers presenting innovative ideas improving the state of the art
Experience papers discussing the issues seen on existing extreme-scale systems, including some form of analysis and evaluation
Extended abstracts proposing disruptive ideas in the field, including some form of preliminary results
Submissions shall be sent electronically, must conform to IEEE conference proceedings style and should not exceed six pages including all text, appendices, and figures. US Letter format, not A4.
All papers will be published, as workshop papers, in the DSN 2012 proceedings and on IEEE Xplore.
Authors are invited to submit papers with unpublished, original work of not more than 8 pages of double column text using single spaced 10 point size on 8.5 x 11 inch pages (including all text, figures, and references), as per ACM 8.5 x 11 manuscript guidelines (document templates can be found at http://www.acm.org/sigs/publications/proceedings-templates).
Papers will be peer-reviewed, and accepted papers will be published in the workshop proceedings as part of the ACM digital library. Submission implies the willingness of at least one of the authors to register and present the paper.
Important Dates
Submission of papers: March 16, 2012 March 24, 2012 - 11:59 PM EST (DEADLINE EXTENDED!)
Author notification: April 13, 2012
Camera ready papers: April 27, 2012
Workshop: June 25, 2012
Workshop Topics
Assuming hardware and software errors will be inescapable at extreme scale, this workshop will consider aspects of fault tolerance particular to extreme scale that include, but are not limited to:
Quantitative assessments of cost in terms of power, performance, and resource impacts of fault-tolerant techniques, such as checkpoint restart, that are redundant in space, time or information
Novel fault-tolerance techniques and implementations of emerging hardware and software technologies that guard against silent data corruption (SDC) in memory, logic, and storage and provide end-to-end data integrity for running applications
Studies of hardware / software tradeoffs in error detection, failure prediction, error preemption, and recovery
Advances in monitoring, analysis, and control of highly complex systems
Highly scalable fault-tolerant programming models
Metrics and standards for measuring, improving and enforcing the need for and effectiveness of fault-tolerance
Failure modeling and scalable methods of reliability, availability, performability and failure prediction for fault-tolerant HPC systems
Scalable Byzantine fault tolerance and security from single-fault and fail-silent violations
Benchmarks and experimental environments, including fault-injection and accelerated lifetime testing, for evaluating performance of resilience techniques under stress
Workshop Organizers
Nathan DeBardeleben - Los Alamos National Laboratory
Jon Stearley - Sandia National Laboratory
Franck Cappello - INRIA and University of Illinois at Urbana Champaign
Program Committee
George Bosilca - University of Tennessee, Knoxville
Greg Bronevetsky - Lawrence Livermore National Laboratory
John Daly - Department of Defense
Christian Engelmann - Oak Ridge National Laboratory
Kurt Ferreira - Sandia National Laboratories
Ana Gainaru - University of Illinois, Urbana-Champaign
Hideyuki Jitsumoto - University of Tokyo
Zbigniew Kalbarczyk - University of Illinois, Urbana-Champaign
Rakesh Kumar - University of Illinois, Urbana-Champaign
Zhiling Lan - Illinois Institute of Technology
Bogdan Nicolae - INRIA
Yve Robert - ENS Lyon
Roel Wuyts - (Intel ExaScience Lab, Leuven, Belgium) and KU Leuven (Leuven, Belgium)
Felix Salfner - SAP Innovation Center Potsdam
Mitsuhisa Sato - University of Tsukuba
Stephen Scott - Oak Ridge National Laboratory and Tennessee Tech University
Questions?
Please address FTXS workshop questions to Nathan DeBardeleben, Los Alamos National Laboratory (ndebard@lanl.gov)