Characterization Lab
PIC: Sanadi Bin Subhi
Email: nadi@iium.edu.my
Phone: 03 - 6421 3317
Location: E5 Level 3
Characterization Lab
PIC: Sanadi Bin Subhi
Email: nadi@iium.edu.my
Phone: 03 - 6421 3317
Location: E5 Level 3
Scanning Probe Microscope (AFM)
Field Emission Scanning Electron Microscope (FESEM)
Transmission Electron Microscope (TEM)
Focus Ion Beam (FIB)
Stirring Hot plate
Lab Dryer
Digital Dry Cabinet