JPK Nanowizard 3 Atomic Force Microscope
The JPK Nanowizard 3 Atomic Force Microscope enables the capture nanoscale topological profiles of materials such as 2D nanomaterials, nanoparticle dispersions and polymers, as well as biological samples such as bacteria and cells, in both air and liquid environments.
The JPK Nanowizard 3 AFM can be used in contact, non-contact and alternating contact modes, for imaging, force spectroscopy, and force mapping. The instrument combines an optical imaging system with AFM imaging and force measurement in order to characterise sample topography, surface and mechanical properties.
We are currently building the capabilities to locally measure conductivity in conjunction with measured height profiles. Each AFM image can span an area of between 5 nm and 50 μm, and can measure height changes from <1 nm - several microns.