Saptarshi Mukherjee

Saptarshi Mukherjee,

Applied Electromagnetics Research Scientist,

Lawrence Livermore National Laboratory (US DOE).

7000 East Ave, Livermore, CA 94550

Office Phone: 925-422-0473

Email: mukherjee5 AT llnl DOT gov

Google scholar profile, Linkedin, Researchgate

Saptarshi Mukherjee received the B.Tech. degree in Electronics and Communication Engineering from the National Institute of Technology, Durgapur, India, in 2013, and the Ph.D. degree in Electrical Engineering from Michigan State University, East Lansing, MI, USA, in 2018. He is currently an Applied Electromagnetics Research Scientist at Lawrence Livermore National Laboratory.

Saptarshi's research interests include electromagnetic (EM) imaging and inversion, computational electromagnetics, microwave sensors and high power RF devices and signal processing techniques for nondestructive evaluation, biomedical and geosciences applications. His current research involves developing :

  • an adjoint EM imaging/ inversion algorithm for tracking the movement of sub-surface CO2,

  • a microwave time reversal imaging system for breast cancer detection without accurate knowledge of breast tissue properties,

  • 3-D microwave imaging system for imaging dynamic detonation fronts during explosions and sub-wavelength detection of damage mechanisms in composite materials,

  • millimeter wave diagnostics and inversion theory for rapid, in-situ characterization of AM components,

  • fusion of topology optimization with AM for design of RF devices (e.g. a voxelized beam-steering lens).

  • designing flexible microwave sensors for structural health monitoring of CO2 sequestration wells,

  • designing microwave metamaterial lens and sensors for super-resolution imaging,

  • utilizing seismo-electric effects for enhanced sub-surface characterization.

Saptarshi has authored or co-authored 1 patent and over 40 technical papers. He received the National Science Foundation International Research Fellowship in 2015, American Society for Nondestructive Testing Graduate Fellowship award in 2017 for his proposal "A hybrid electromagnetic imaging system for rapid inspection of composites" and the American Society for Nondestructive Testing Travel Grant Fellowship award in 2018. He is also the third place recipient of the Outstanding Graduate student award at the Department of Electrical Engineering, Michigan State University in 2018 and serves as a reviewer of overall 18 scientific journals.

Saptarshi_mukherjee_CV.pdf