Hitachi S-4800 FE-SEM Lab
Departments of Chemistry
Rutgers University - Newark
The SEM Lab in the Department of Chemistry at Rutgers University-Newark houses an Hitachi S-4800 cold field emission scanning electron microscope.
Our S-4800 has the standard secondary electron (SE) and backscatter electron (BSE) detectors, as well as a transmission electron (TE) detector with brightfield and darkfield modes and an EDAX energy dispersive X-ray spectrometer (EDS) for semi-quantitative composition analysis of materials.
The Hitachi S-4800 is equipped to handle most analytical needs, with capabilities to satisfy the most demanding imaging requirements:
Magnification: Low Mag – 30x to 2000x; High Mag – 100x to 800,000x
Accelerating voltages: 0.5kV to 30 kV
Resolution: down to 1 nm @ 15kV; 2 nm @ 2 kV