Root Causing Flaky Tests in a

Large-Scale Industrial Setting

RootFinder tool and logs: https://github.com/winglam/RootFinder

Paper: http://mir.cs.illinois.edu/winglam/publications/2019/LamETAL19RootFinder.pdf

If you use any of this work, please cite our corresponding paper:

@inproceedings{LamETAL19RootFinder,
author = "Wing Lam and Patrice Godefroid and Suman Nath and Anirudh Santhiar and Suresh Thummalapenta",
title = "Root causing flaky tests in a large-scale industrial setting",
booktitle = "ISSTA 2019: ACM SIGSOFT International Symposium on Software Testing and Analysis",
month = "July",
year = "2019",
address = "Beijing, China",
pages = "101--111"
}

Most of the work of Wing Lam was done while visiting Microsoft. We thank Ankush Das for his contributions to an early version of this work. We also thank Owolabi Legunsen, Darko Marinov, August Shi, and Tao Xie for their discussions about flaky tests. We also acknowledge support for research on flaky tests and test quality from Huawei and Microsoft.