It's slightly difficult to tell, but are you working with the stress analysis tools in Inventor? If so, you should be able to change the points for XYZ to give it a different location. You should also be able to select it based off of where you click initially. I normally select to add a force, then Inventor allows me to choose where I want the force to go, as well as the direction, the magnitude, and any axis I want the force to be parallel to. (For reference, I am using Inventor 2017.)
The remote force tool is intended to be used to position a force somewhere in the free space outside of your model.
This is done by using the remote point dialog box. When you select a face or feature, the force will be applied at the given dimensions away from this face or feature.
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I think your answer " based on where you click initially" may be the clue.I will give that a try and see what happens.I do understand that by changing the xyz co-ordinates that this will reposition the force,it was the original location that was the problem.
You are right, I tested it on the model. I applied a remote force placed in the same place first to one face, then to the other. The calculation results are as expected under the action of this force on the selected faces.
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Hello there
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I do not remember back that far, but it seems to me selecting the face, the load is spread across the face. The location of the glyph is reference only. Just to be sure that was the way it was back in r11 attach your file here. (load at point usually wouldn't make sense as stress = force/area with point area = 0 ....
when you select a face the force will be distributed on that face. the use of split lines on a face will help you localize the force. Applying a force evenly to a table top would probably never happen.
You can show that the force is even distributed by clicking on the top face off to the side and notice that the stress in each corner where the legs are will be the same. Conversely if you create a split off to the side and apply a force to that face you will notice a difference.
If you look at the attached image you will see I applied the force within the circle which is in the bottom right corner. The equivalent stress is the highest at that corner and the lowest in the top left.
The general process that it follows is it opens the assembly, and sets the level of detail of various sub-assemblies to match user configured options. It then saves the assembly and opens a drawing that references it. From there it generates a pdf output.The problem is that the views do not show the levels of detail that have been set on the model components. So I'm wondering if there is a way to force an update before outputting the pdf?
Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.
Atomic force microscopy[1] (AFM) is a type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The information is gathered by "feeling" or "touching" the surface with a mechanical probe. Piezoelectric elements that facilitate tiny but accurate and precise movements on (electronic) command enable precise scanning. Despite the name, the Atomic Force Microscope does not use the Nuclear force.
In force measurement, AFMs can be used to measure the forces between the probe and the sample as a function of their mutual separation. This can be applied to perform force spectroscopy, to measure the mechanical properties of the sample, such as the sample's Young's modulus, a measure of stiffness.
For imaging, the reaction of the probe to the forces that the sample imposes on it can be used to form an image of the three-dimensional shape (topography) of a sample surface at a high resolution. This is achieved by raster scanning the position of the sample with respect to the tip and recording the height of the probe that corresponds to a constant probe-sample interaction (see Topographic image for more). The surface topography is commonly displayed as a pseudocolor plot.
In manipulation, the forces between tip and sample can also be used to change the properties of the sample in a controlled way. Examples of this include atomic manipulation, scanning probe lithography and local stimulation of cells.
The major difference between atomic force microscopy and competing technologies such as optical microscopy and electron microscopy is that AFM does not use lenses or beam irradiation. Therefore, it does not suffer from a limitation in spatial resolution due to diffraction and aberration, and preparing a space for guiding the beam (by creating a vacuum) and staining the sample are not necessary.
The AFM consists of a cantilever with a sharp tip (probe) at its end that is used to scan the specimen surface. The cantilever is typically silicon or silicon nitride with a tip radius of curvature on the order of nanometers. When the tip is brought into proximity of a sample surface, forces between the tip and the sample lead to a deflection of the cantilever according to Hooke's law.[10] Depending on the situation, forces that are measured in AFM include mechanical contact force, van der Waals forces, capillary forces, chemical bonding, electrostatic forces, magnetic forces (see magnetic force microscope, MFM), Casimir forces, solvation forces, etc. Along with force, additional quantities may simultaneously be measured through the use of specialized types of probes (see scanning thermal microscopy, scanning joule expansion microscopy, photothermal microspectroscopy, etc.).
In contact mode, the tip is "dragged" across the surface of the sample and the contours of the surface are measured either using the deflection of the cantilever directly or, more commonly, using the feedback signal required to keep the cantilever at a constant position. Because the measurement of a static signal is prone to noise and drift, low stiffness cantilevers (i.e. cantilevers with a low spring constant, k) are used to achieve a large enough deflection signal while keeping the interaction force low. Close to the surface of the sample, attractive forces can be quite strong, causing the tip to "snap-in" to the surface. Thus, contact mode AFM is almost always done at a depth where the overall force is repulsive, that is, in firm "contact" with the solid surface.
In ambient conditions, most samples develop a liquid meniscus layer. Because of this, keeping the probe tip close enough to the sample for short-range forces to become detectable while preventing the tip from sticking to the surface presents a major problem for contact mode in ambient conditions. Dynamic contact mode (also called intermittent contact, AC mode or tapping mode) was developed to bypass this problem.[12] Nowadays, tapping mode is the most frequently used AFM mode when operating in ambient conditions or in liquids.
In tapping mode, the cantilever is driven to oscillate up and down at or near its resonance frequency. This oscillation is commonly achieved with a small piezo element in the cantilever holder, but other possibilities include an AC magnetic field (with magnetic cantilevers), piezoelectric cantilevers, or periodic heating with a modulated laser beam. The amplitude of this oscillation usually varies from several nm to 200 nm. In tapping mode, the frequency and amplitude of the driving signal are kept constant, leading to a constant amplitude of the cantilever oscillation as long as there is no drift or interaction with the surface. The interaction of forces acting on the cantilever when the tip comes close to the surface, van der Waals forces, dipole-dipole interactions, electrostatic forces, etc. cause the amplitude of the cantilever's oscillation to change (usually decrease) as the tip gets closer to the sample. This amplitude is used as the parameter that goes into the electronic servo that controls the height of the cantilever above the sample. The servo adjusts the height to maintain a set cantilever oscillation amplitude as the cantilever is scanned over the sample. A tapping AFM image is therefore produced by imaging the force of the intermittent contacts of the tip with the sample surface.[13]
Although the peak forces applied during the contacting part of the oscillation can be much higher than typically used in contact mode, tapping mode generally lessens the damage done to the surface and the tip compared to the amount done in contact mode. This can be explained by the short duration of the applied force, and because the lateral forces between tip and sample are significantly lower in tapping mode over contact mode.Tapping mode imaging is gentle enough even for the visualization of supported lipid bilayers or adsorbed single polymer molecules (for instance, 0.4 nm thick chains of synthetic polyelectrolytes) under liquid medium. With proper scanning parameters, the conformation of single molecules can remain unchanged for hours,[11] and even single molecular motors can be imaged while moving.
In non-contact atomic force microscopy mode, the tip of the cantilever does not contact the sample surface. The cantilever is instead oscillated at either its resonant frequency (frequency modulation) or just above (amplitude modulation) where the amplitude of oscillation is typically a few nanometers ( be457b7860
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