Conference papers

[38] I Huh, C Jeong, JM Choe, Y KIM, D Kim, Isometric Quotient Variational Auto-Encoders for Structure-Preserving Representation Learning, Advances in Neural Information Processing Systems (NeurIPS), 2024

[37] Changwook Jeong, Sanghoon Myung, Byungseon Choi, Jinwoo Kim, Wonik Jang, In Huh, Jae Myung Choe, Young-Gu Kim, Dae Sin Kim, Deep Learning for Semiconductor Materials and Devices Design IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 2023

[36] S Myung, I Huh, W Jang, JM Choe, J Ryu, D Kim, KE Kim, C Jeong, PAC-Net: A model pruning approach to inductive transfer learning, International Conference on Machine Learning (ICML), 2022

[35] Dae Young Park, Moon-Hyun Cha, Changwook Jeong, Dae Sin Kim, and Bohyung Han, Learning student-friendly teacher networks for knowledge distillation, Advances in Neural Information Processing Systems (NeurIPS), 2021

[34] Changwook Jeong, Sanghoon Myung, Jinwoo Kim, Hyunjae Jang, Byungseon Choi, Hyowon Moon, Jisu Ryu, Jae Myung Choe, Dae Sin Kim, Hybrid Modeling of TCAD and AI for Semiconductor Design, International Workshop on Computational Nanotechnology, 2021

[33] C Jeong, S Myung, I Huh, B Choi, J Kim, H Jang, H Lee, D Park, K Lee, ..., Bridging TCAD and AI: Its application to semiconductor design, IEEE Transactions on Electron Devices (TED), 2021

[32] J Wang, YH Kim, J Ryu, C Jeong, W Choi, D Kim, Artificial neural network-based compact modeling methodology for advanced transistors, IEEE Transactions on Electron Devices, 2021

[31] S Myung, W Jang, S Jin, J Choe, C Jeong, DS Kim, Restructuring TCAD System: Teaching Traditional TCAD New Tricks, IEEE International Electron Devices Meeting (IEDM), 2021

[30] DY Park, MH Cha, C Jeong, D Kim, B Han, Learning student-friendly teacher networks for knowledge distillation, Advances in neural information processing systems (NeurIPS), 2021

[29] Hyojin Choi, In Huh, Seungju Kim, Jeonghoon Ko, Changwook Jeong, Hyeonsik Son, Kiwon Kwon, Joonwan Chai, Younsik Park, Jaehoon Jeong, Dae Sin Kim, Jung Yun Choi, Application of deep reinforcement learning to dynamic verification of dram designs, 58th ACM/IEEE Design Automation Conference (DAC), 2021

[28] Yohan Kim, Sanghoon Myung, Jisu Ryu, Changwook Jeong, Dae Sin Kim, Physics-augmented neural compact model for emerging device technologies, International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), 2020

[27] S Myung, J Kim, Y Jeon, W Jang, I Huh, J Kim, S Han, K Baek, J Ryu, ..., Real-time TCAD: A new paradigm for TCAD in the artificial intelligence era, International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), 2020

[26] JG Min, C Jeong, U Kwon, DS Kim, S Kim, I Kim, JS Yang, The Impact of Dislocation on Bulk -Si FinFET Technologies: Physical Modeling of Strain Relaxation and Enhancement by Dislocation, IEEE 13th Nanotechnology Materials and Devices Conference (NMDC), 2018

[26] M Ali Pourghaderi, Chulwoo Park, Jongchol Kim, Changwook Jeong, Won-Young Chung, Keun-Ho Lee, Hong-Hyun Park, Anh-Tuan Pham, Seonghoon Jin, Woosung Choi, Nanoscale-nMOSFET junction design: Quantum transport approach, International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), 2017

[25] S Dhar, HK Noh, SJ Kim, HW Kim, Z Wu, WS Lee, KK Bhuwalka, JC Kim, CW Jeong, UH Kwon, S Maeda, KH Lee, AT Pham, S Jin, WS Choi, Impact of BTBT, stress and interface charge on optimum Ge in SiGe pMOS for low power applications, International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), 2016

[24] H.-J. Cho, H.S. Oh, K.J. Nam, Y.H. Kim, K.H. Yeo, W.D. Kim, Y.S. Chung, Y.S. Nam, S.M. Kim, W.H. Kwon, M.J. Kang, I.R. Kim, H. Fukutome, C.W. Jeong, H.J. Shin, Y.S. Kim, D.W., Si FinFET based 10nm technology with multi Vt gate stack for low power and high performance applications, IEEE Symposium on VLSI Technology, 2016

[23] C Jeong, HH Park, S Dhar, S Park, K Lee, S Jin, W Choi, UH Kwon, ..., Physical understanding of alloy scattering in SiGe channel for high-performance strained pFETs, IEEE International Electron Devices Meeting (IEDM), 2013

[22] R Chen, SR Das, C Jeong, DB Janes, MA Alam, Exclusive electrical determination of high-resistance grain-boundaries in poly-graphene, 70th Device Research Conference, 2012

[21] C Jeong, G Klimeck, M Lundstrom, Computational study of the electronic performance of cross-plane superlattice Peltier devices, MRS Online Proceedings Library, 2011

[20] C Jeong, M Lundstrom, On Seebeck Coefficients in Nanostrucutred Graphene and Molecules, APS March Meeting Abstracts, 2010

[19] Changwook Jeong, Dimitri A Antoniadis, Mark S Lundstrom, On backscattering and mobility in nanoscale silicon MOSFETs, IEEE Transactions on electron devices, 2009

[18] DH Kang, JS Kim, YR Kim, YT Kim, MK Lee, YJ Jun, JH Park, F Yeung, CW Jeong, J Yu, JH Kong, DW Ha, SA Song, J Park, YH Park, YJ Song, CY Eum, KC Ryoo, JM Shin, DW Lim, SS Park, JH Kim, WI Park, KR Sim, JH Cheong, JH Oh, JI Kim, YT Oh, KW Lee, SP Koh, SH Eun, NB Kim, GH Koh, GT Jeong, HS Jeong, Kinam Kim, Novel heat dissipating cell scheme for improving a reset distribution in a 512M phase-change random access memory (PRAM), IEEE Symposium on VLSI Technology, 2007

[17] JH Oh, Jae Hyo Park, YS Lim, HS Lim, YT Oh, Jong Soo Kim, JM Shin, Young Jun Song, KC Ryoo, DW Lim, SS Park, JI Kim, JH Kim, J Yu, F Yeung, CW Jeong, JH Kong, DH Kang, GH Koh, GT Jeong, HS Jeong, Kinam Kim, Full integration of highly manufacturable 512Mb PRAM based on 90nm technology, International Electron Devices Meeting (IEDM), 2006

[16] YJ Song, KC Ryoo, YN Hwang, CW Jeong, DW Lim, SS Park, JI Kim, JH Kim, SY Lee, J Kong, S Ahn, SH Lee, JH Park, JH Oh, YT Oh, JS Kim, J Shin, J Park, Y Fai, G Koh, GT Jeong, RH Kim, HS Lim, IS Park, HS Jeong, H Jeong, K Kim, Highly reliable 256Mb PRAM with advanced ring contact technology and novel encapsulating technology, IEEE Symposium on VLSI Technology, 2006

[15] KC Ryoo, YJ Song, DH Kang, CW Jeong, JH Kong, LIM DW OH JH, SS PARK, JI KIM, JH KIM, JH PARK, KIM JS OH YT, JM SHIN, KW LEE, Y FAI, GH KOH, GT JEONG, HS JEONG, Kinam KIM, Optimization of Ring Type Electrode Process for High Density PRAM, Conference on Solid State Devices and Materials, 2006

[14] YJ Song, JH Park, SY Lee, Jae-Hyun Park, YN Hwang, SH Lee, KC Ryoo, SJ Ahn, CW Jeong, JM Shin, WC Jeong, KH Koh, GT Jeong, HS Jeong, KN Kim, Advanced ring type contact technology for high density phase change memory, Proceedings of 35th European Solid-State Device Research Conference, 2005

[13] GT Jeong, YN Hwang, SH Lee, SY Lee, KC Ryoo, JH Park, YJ Song, SJ Ahn, CW Jeong, Y-T Kim, H Horii, YH Ha, GH Koh, HS Jeong, Kinam Kim, Process technologies for the integration of high density phase change RAM, International Conference on Integrated Circuit Design and Technology, 2005

[12] JH Park, WC Jeong, JH Oh, CW Jeong, JM Shin, YN Hwang, SJ Ahn, SH Lee, SY Lee, KC Ryoo, Jonghyun Park, F Yang, GH Koh, GT Jeong, HS Jeong, Kinam Kim, Integration technologies for scalable high density MRAM, IEEE VLSI-TSA International Symposium on VLSI Technology, 2005

[11] W.C. Jeong, J.H. Oh, C.W. Jeong, J.M. Shin, Y.N. Hwang, S.J. Ahn, S.H. Lee, Integration technologies for scalable high density MRAM, IEEE VLSI-TSA International Symposium on VLSI Technology, 2005

[10] Su-Jin Ahn, YN Hwang, YJ Song, SH Lee, SY Lee, JH Park, CW Jeong, KC Ryoo, JM Shin, Y Fai, JH Oh, GH Koh, GT Jeong, SH Joo, SH Choi, YH Son, JC Shin, YT Kim, HS Jeong, Kinam Kim, Highly reliable 50nm contact cell technology for 256Mb PRAM, IEEE Symposium on VLSI Technology, 2005

[9] CW Jeong, SJ Ahn, YN Hwang, YJ Song, LEE SY OH JH, SH LEE, KC RYOO, JH PARK, JM SHIN, Jae-Hyun PARK, F YEUNG, WC JEONG, YT KIM, KH KOH, GT JEONG, HS JEONG, KN KIM, Highly Reliable Ring Type Contact Scheme for High Density PRAM, Conference on Solid State Devices and Materials, 2005

[8] CW Jeong, SJ Ahn, YN Hwang, YJ Song, JH Oh, SY Lee, SH Lee, KC Ryoo, JH Park, JM Shin, EY Lee, F Yeung, WC Jeong, YT Kim, JB Park, KH Koh, GT Jeong, HS Jeong, KN Kim, Switching current scaling and reliability evaluation in PRAM, IEEE Non-Volatile Semiconductor Memory Workshop, 2004

[7] KC Ryoo, YN Hwang, SH Lee, S Lee, SJ Ahn, YJ Song, JH Park, CW Jeong, JM Shin, WC Jeong, KH Koh, GT Jeong, HS Jeong, KN Kim, Integration and cell characteristics for high density PRAM, Proceedings of the 30th European Solid-State Circuits Conference, 2004

[6] SJ AHN, YN HWANG, CW JEONG, YJ SONG, SY LEE, SH LEE, KC RYOO, JH PARK, JM SHIN, EY LEE, WC JEONG, YT KIM, KH KOH, GT JEONG, HS JEONG, KN KIM, GST Confined Structure and Integration of 64Mb PRAM, International Conference on Solid State Devices and Materials, 2004

[5] WC Jeong, HJ Kim, JH Park, CW Jeong, EY Lee, JH Oh, GT Jeong, GH Koh, HC Koo, SH Lee, SY Lee, JM Shin, HS Jeong, Kinam Kim, A new reference signal generation method for MRAM using a 90-degree rotated MTJ, IEEE transactions on magnetics, 2004

[4] SH Lee, YN Hwang, SY Lee, KC Ryoo, SJ Ahn, HC Koo, CW Jeong, Y-T Kim, GH Koh, GT Jeong, HS Jeong, Kinam Kim, Full integration and cell characteristics for 64Mb nonvolatile PRAM, IEEE Symposium on VLSI Technology, 2004

[3] SJ Ahn, YJ Song, CW Jeong, JM Shin, Y Fai, YN Hwang, SH Lee, KC Ryoo, SY Lee, JH Park, H Horii, YH Ha, JH Yi, BJ Kuh, GH Koh, GT Jeong, HS Jeong, Kinam Kim, BI Ryu, Highly manufacturable high density phase change memory of 64Mb and beyond, IEEE International Electron Devices Meeting (IEDM), 2004

[2] GH Koh, YN Hwang, SH Lee, SY Lee, KC Ryoo, JH Park, YJ Song, SJ Ahn, CW Jeong, F Yeung, Y-T Kim, J-B Park, GT Jeong, HS Jeong, Kinam Kim, “PRAM process technology”, IEEE International Conference on Integrated Circuit Design and Technology, 2004

[1] Chang-Wook Jeong, Won-Cheol Jeong, Seung-Ki Joo, Magnetoresistance of ferromagnetic tunnel junctions with Al_2O_3 formed by Plasma-Assisted Atomic Layer Controlled Deposition, ITE Technical Report, 2000