IEEE Conference on Virtual Reality (IEEE VR)

2nd Workshop

Datasets for Developing Intelligent XR Applications

Hybrid event - March 25-29, 2023


Whenever AI researchers want to propose different data-driven models, datasets are the most fundamental resources. With easy access to standard datasets, they can develop state-of-the-art AI algorithms to achieve excellent prediction performance. However, when XR researchers decide to import these algorithms for developing intelligent immersive interactive applications, the lack of publicly available datasets arises as a challenge despite advanced AI algorithms being developed.

Many works related to datasets have been published, e.g., MINIST, ImageNet, CIFAR-10, etc. To unleash the full power of XR, the community also needs standard datasets for developing data-driven models with machine/deep learning. The workshop on Datasets for Developing Intelligent XR Applications (Data4XR), hosted by the IEEE VR 2023, proposes a meaningful platform for domain researchers to find valuable resources and develop collaborations across labs. It aims to promote XR research by involving artificial intelligence.


The workshop invites researchers to submit 1) technical papers aimed towards introducing their published datasets that can be easily accessed and used to develop data-driven models, 2) position papers describing ethics, early-stage concepts, preliminary ideas for sharable datasets creation and standardization, 3) research papers that integrate data-driven models into XR studies. The submission can be 4-6 pages on any of the following topics but not limited to:

    • Multisensory interfaces and rendering

    • Multimodal/cross-modal interaction, perception, and cognition

    • 3D user interaction and experience

    • Intelligent concurrent engineering

    • Digital twin model use cases

    • Interactive simulation models and algorithms

    • Adaptive VR/AR interaction frameworks

    • Interactive reasoning for intelligent user interaction feedback in VR/AR

    • Human factors and ergonomics

    • User modeling and computational interaction

    • Data ethics and protection in XR

Invited Speaker

TBA ()


Title: TBA


Bio: xx is axx.

Important dates

  • Submission deadline - January 9, 2023

  • Notification - January 20, 2023

  • Camera ready deadline - February 3, 2023

  • Workshop date - March 25-29, 2023 (to be adjusted)

Submission Guidelines

All paper submissions must be in English and must comprise 6 pages maximum, NOT including references. All Data4XR Workshop Paper submissions must be prepared in IEEE Computer Society VGTC format ( and submitted in PDF format. We highly encourage authors to use the LaTeX template. However, authors who choose to use the MS Word template should ensure that the PDF submission matches the PDF format template (

A DOUBLE-BLIND review process will be used. This means that both the authors and the reviewers should remain anonymous to each other. Submissions (including citations) should not contain information that identifies the authors, their institutions, funding sources, or their places of work. Relevant previous work by the authors should be cited in the third person to preserve anonymity. Authors should work diligently to ensure that their submissions do not expose their identities either through carelessness or intentionality. Authors that have questions/issues around double-blind submission policy should contact the conference chairs at the above-mentioned email address.

IEEE VR Workshops proceedings will be published electronically through the IEEE Digital Library.

NOTE: papers rejected from the IEEE VR conference track are encouraged to be resubmitted if they can fit the topic of this workshop. In this case, the authors have to submit 1) the revised version of the paper, 2) the review report from the conference reviewers, 3) one page summary of rebuttal.

Organizing Committee

Yuyang WANG

Hong Kong University of Science and Technology, China


Arts et Métiers Institute of Technology, France

Lik-Hang (Paul) LEE

Korea Advanced Inst. of Science and Technology, Korea


Hong Kong University of Science and Technology, China


If you have any questions, please contact Yuyang Wang (yuyangwang[at], Jean-Rémy Chardonnet (jean-remy.chardonnet[at], Lik-Hang (Paul) Lee (likhang.lee[at] or Pan Hui (panhui[at]