- End-to-End Metric Learning From Corrupted Images Using Triplet Dimensionality Reduction Loss

Juhyeon Park, Jin Hong,  and Junseok Kwon, Expert Systems with Applications (ESWA),  vol 238, Part C, 2024 [pdf] [code]

ACK: 2021-0-01341, Artificial Intelligence Graduate School Program, NRF-2020R1C1C1004907

- Zero-Variance Minibatch Monte Carlo for Pixel-Wise Visual Tracking

Juhyeon Park and Junseok Kwon, Electronics Letters (EL), vol. 56, no. 21, Oct, page 1118 - 1120, 2020 [pdf]

ACK: CAU Scholarship Grants, IITP-2020-2018-0-01799